Published 1989 | Version v1
Report

Simulation of radar and radiometer signals remote sensing cometary surface and subsurface structures

  • 1. Bochum Univ. (Germany, F.R.)

Description

Results of numerical calculations in the microwave range are presented concerned with the reflection, backscattering, and emission coefficient of simulated cometary surfaces as a function of signal frequency, angle of incidence, polarization, and surface roughness. The variations of the dielectric permittivity and loss tangent are estimated as to be expected for typical cometary surface conditions. The spatial resolution of potential Rosetta radar measurements is discussed. The subsurface penetration depth is given and a one-layer model is introduced. Preliminary results from experimental investigations are also presented simulating radar measurements probing a cometary surface in the frequency range 8 to 12.5 GHz. A special calibration technique using time domain transformation is applied to resolve the cometary reflection coefficient against background noise as to be expected in a simulation chamber. The results are discussed for different surface conditions and it is shown how specific surface and subsurface parameters can be determined

Part of:
Physics and Mechanics of Cometary Materials

Additional details

Publishing Information

Imprint Title
Physics and Mechanics of Cometary Materials
Imprint Pagination
246 p.
Journal Page Range
p. 129-140.
Report number
ESA-SP--302

Conference

Title
International Workshop on Physics and Mechanics of Cometary Materials.
Dates
9-11 Oct 1989.
Place
Muenster (Germany, F.R.).

INIS

Country of Publication
France
Country of Input or Organization
France
INIS RN
21088800
Subject category
S79: ASTROPHYSICS, COSMOLOGY AND ASTRONOMY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
COMETS; EMISSIVITY; RADAR; REFLECTION; SCATTERING; SIMULATION; STRUCTURAL MODELS; SURFACES
Descriptors DEC
MEASURING INSTRUMENTS; OPTICAL PROPERTIES; PHYSICAL PROPERTIES; RANGE FINDERS; SURFACE PROPERTIES

Optional Information