Published January 2005
| Version v1
Journal article
Improved parameterization of non-conventional tight-binding method for simulation of silicon nano clusters
- 1. AS RU, Institute of Nuclear Physics, Tashkent (Uzbekistan)
- 2. University at Buffalo (SUNY), Department of Chemical and Biological Engineering, Buffalo (United States)
Description
This work presents an improved parameterization of non-conventional tight-binding method for simulation of silicon clusters. In the framework of tight-binding approximation and the same parameterization scheme we have been able for the first time to calculate four properties (cohesive energy, geometry, ionization potentials, electronic affinities) of small silicon clusters Sin (n≤ 7) with accuracy that comparable with that of first-principles calculations. In whole, our results are in better agreement with the experimental data than those of first-principles calculations. (author)
Additional details
Publishing Information
- Journal Title
- Uzbekiston Fizika Zhurnali
- Journal Volume
- 6
- Journal Issue
- 4
- Journal Page Range
- p. 264-269
- ISSN
- 1025-8817
INIS
- Country of Publication
- Uzbekistan
- Country of Input or Organization
- Uzbekistan
- INIS RN
- 37083836
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ACCURACY; AFFINITY; ATOMIC CLUSTERS; BINDING ENERGY; HAMILTONIAN FUNCTION; IONIZATION POTENTIAL; NANOSTRUCTURES; SILICON; SIMULATION
- Descriptors DEC
- ELEMENTS; ENERGY; FUNCTIONS; SEMIMETALS
Optional Information
- Notes
- 34 refs., 1 fig., 2 tabs.