Published January 2005 | Version v1
Journal article

Improved parameterization of non-conventional tight-binding method for simulation of silicon nano clusters

  • 1. AS RU, Institute of Nuclear Physics, Tashkent (Uzbekistan)
  • 2. University at Buffalo (SUNY), Department of Chemical and Biological Engineering, Buffalo (United States)

Description

This work presents an improved parameterization of non-conventional tight-binding method for simulation of silicon clusters. In the framework of tight-binding approximation and the same parameterization scheme we have been able for the first time to calculate four properties (cohesive energy, geometry, ionization potentials, electronic affinities) of small silicon clusters Sin (n≤ 7) with accuracy that comparable with that of first-principles calculations. In whole, our results are in better agreement with the experimental data than those of first-principles calculations. (author)

Additional details

Publishing Information

Journal Title
Uzbekiston Fizika Zhurnali
Journal Volume
6
Journal Issue
4
Journal Page Range
p. 264-269
ISSN
1025-8817

INIS

Country of Publication
Uzbekistan
Country of Input or Organization
Uzbekistan
INIS RN
37083836
Subject category
S36: MATERIALS SCIENCE;
Descriptors DEI
ACCURACY; AFFINITY; ATOMIC CLUSTERS; BINDING ENERGY; HAMILTONIAN FUNCTION; IONIZATION POTENTIAL; NANOSTRUCTURES; SILICON; SIMULATION
Descriptors DEC
ELEMENTS; ENERGY; FUNCTIONS; SEMIMETALS

Optional Information

Notes
34 refs., 1 fig., 2 tabs.