Published December 2011 | Version v1
Journal article

Medipix2/Timepix detector for time resolved Transmission Electron Microscopy

  • 1. School of Physics and Astronomy, Kelvin Building, University of Glasgow, Glasgow G12 8QQ, Scotland (United Kingdom)

Description

We have investigated the use of a Timepix detector as a method for increasing the realisable temporal resolution of a conventional 200keV transmission electron microscope (TEM). Evaluation of both single and integral mode image exposures was performed. Single exposure mode images showed that the available electron beam current became the limiting factor for timescales < 100 μs. Analysis of integral mode images showed that exposures times down to 500 ns were possible but that increases in image intensity and noise occurred. The performance data obtained represents a significant performance improvement on current TEM CCD imaging detectors.

Availability note (English)

Available from http://dx.doi.org/10.1088/1748-0221/6/12/C12052

Additional details

Publishing Information

Journal Title
Journal of Instrumentation
Journal Volume
6
Journal Issue
12
Journal Page Range
p. C12052
ISSN
1748-0221

Conference

Title
13. international workshop on radiation imaging detectors
Dates
3-7 Jul 2011
Place
Zurich (Switzerland)

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
44052735
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
CHARGE-COUPLED DEVICES; ELECTRON BEAMS; IMAGES; NOISE; PERFORMANCE; TIME RESOLUTION; TRANSMISSION ELECTRON MICROSCOPY
Descriptors DEC
BEAMS; ELECTRON MICROSCOPY; LEPTON BEAMS; MICROSCOPY; PARTICLE BEAMS; RESOLUTION; SEMICONDUCTOR DEVICES; TIMING PROPERTIES