Published December 2011
| Version v1
Journal article
Medipix2/Timepix detector for time resolved Transmission Electron Microscopy
- 1. School of Physics and Astronomy, Kelvin Building, University of Glasgow, Glasgow G12 8QQ, Scotland (United Kingdom)
Description
We have investigated the use of a Timepix detector as a method for increasing the realisable temporal resolution of a conventional 200keV transmission electron microscope (TEM). Evaluation of both single and integral mode image exposures was performed. Single exposure mode images showed that the available electron beam current became the limiting factor for timescales < 100 μs. Analysis of integral mode images showed that exposures times down to 500 ns were possible but that increases in image intensity and noise occurred. The performance data obtained represents a significant performance improvement on current TEM CCD imaging detectors.
Availability note (English)
Available from http://dx.doi.org/10.1088/1748-0221/6/12/C12052Additional details
Identifiers
Publishing Information
- Journal Title
- Journal of Instrumentation
- Journal Volume
- 6
- Journal Issue
- 12
- Journal Page Range
- p. C12052
- ISSN
- 1748-0221
Conference
- Title
- 13. international workshop on radiation imaging detectors
- Dates
- 3-7 Jul 2011
- Place
- Zurich (Switzerland)
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 44052735
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- CHARGE-COUPLED DEVICES; ELECTRON BEAMS; IMAGES; NOISE; PERFORMANCE; TIME RESOLUTION; TRANSMISSION ELECTRON MICROSCOPY
- Descriptors DEC
- BEAMS; ELECTRON MICROSCOPY; LEPTON BEAMS; MICROSCOPY; PARTICLE BEAMS; RESOLUTION; SEMICONDUCTOR DEVICES; TIMING PROPERTIES