Published November 2005
| Version v1
Miscellaneous
Interface characterization of Pd/4H-SiC contact system by using a soft X-ray fluorescence spectroscopy
Creators
- 1. Okayama Univ., Graduate School of Natural Science and Technology, Okayama (Japan)
Description
no abstract available
Additional details
Publishing Information
- Imprint Title
- Activity report of Synchrotron Radiation Laboratory 2004
- Imprint Pagination
- 115 p.
- Journal Page Range
- p. 97-98
INIS
- Country of Publication
- Japan
- Country of Input or Organization
- Japan
- INIS RN
- 39099949
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Non-conventional Literature, No Abstract
- Descriptors DEI
- ELECTRIC CONDUCTIVITY; ELECTRONIC STRUCTURE; INTERFACES; PALLADIUM; PHOTOEMISSION; SCHOTTKY EFFECT; SEMICONDUCTOR DEVICES; SILICON CARBIDES; SOFT X RADIATION; SYNCHROTRON RADIATION; THIN FILMS; X-RAY FLUORESCENCE ANALYSIS
- Descriptors DEC
- BREMSSTRAHLUNG; CARBIDES; CARBON COMPOUNDS; CHEMICAL ANALYSIS; ELECTRICAL PROPERTIES; ELECTROMAGNETIC RADIATION; ELEMENTS; EMISSION; FILMS; IONIZING RADIATIONS; METALS; NONDESTRUCTIVE ANALYSIS; PHYSICAL PROPERTIES; PLATINUM METALS; RADIATIONS; SECONDARY EMISSION; SILICON COMPOUNDS; TRANSITION ELEMENTS; X RADIATION; X-RAY EMISSION ANALYSIS
Optional Information
- Notes
- 1 ref., 2 figs.