Published 1993
| Version v1
Miscellaneous
The effect of electron irradiation on Pb S thin films for IR detectors
- 1. Institute for Physics and Technology of Materials, Bucharest, P.O.Box MG-6, (Romania)
- 2. Institute for Physics and Technology of Radiation Devices, Bucharest, P.O.Box MG-6, (Romania)
- 3. Faculty of Physics, University of Craiova, Craiova, (Romania)
Description
In this paper the effect of electron irradiation of Pb S thin films for IR detectors is being investigated. Pb S thin films are obtained by chemical precipitation on a glass substrate. The samples were subjected to irradiation with 7 MeV electrons supplied by an electron linear accelerator. Comparative measurements on IR irradiation devices have been performed both at the room and the liquid nitrogen temperature. In the latter case, improvements of some electro-optical parameters (signal/noise ratio, time of response, and so on) have been obtained. (Author)
Additional details
Publishing Information
- Publisher
- Institute of Atomic Physics. Information and Documentation Office.
- Imprint Place
- Bucharest (Romania)
- Imprint Title
- National Physics Conference
- Imprint Pagination
- 160 p.
- Journal Page Range
- p. 67.
Conference
- Title
- National Physics Conference.
- Dates
- 13-15 Oct 1993.
- Place
- Constanta (Romania).
INIS
- Country of Publication
- Romania
- Country of Input or Organization
- Romania
- INIS RN
- 25033076
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference, Non-conventional Literature
- Descriptors DEI
- ELECTRON BEAMS; INFRARED RADIATION; IRRADIATION; LEAD SULFIDES; MEV RANGE 01-10; RADIATION DETECTORS; THIN FILMS
- Descriptors DEC
- BEAMS; CHALCOGENIDES; ELECTROMAGNETIC RADIATION; ENERGY RANGE; FILMS; LEAD COMPOUNDS; LEPTON BEAMS; MEASURING INSTRUMENTS; MEV RANGE; PARTICLE BEAMS; RADIATIONS; SULFIDES; SULFUR COMPOUNDS