Published 1989
| Version v1
Book
Synchrotron radiation research on semiconductor interfaces
Creators
- 1. Laboratoire pour l'Utilisation du Rayonnement Electromagnetique, CNRS-CEA-MEN, Universite de Paris-Sud, F-91405 Orsay (France)
Description
This paper presents a review of some recent results in interface science, which were made possible by the use of synchrotron radiation (SR) surface crystallographic techniques. The main techniques are briefly introduced and examples are given. SR-based crystallography and spectroscopy allow the study of in-situ grown (MBE or conventional sample preparation techniques) surfaces and interfaces with access to both atomic geometry related measurements and spectroscopic measurements, on the same sample or on replica samples
Additional details
Additional titles
- Subtitle (English)
- Surface crystallography
Publishing Information
- Publisher
- World Scientific Pub. Co.
- Imprint Place
- Teaneck, NJ (USA)
- ISBN
- 9971-50-843-5
- Imprint Title
- Synchrotron light
- Imprint Pagination
- 300 p.
- Journal Page Range
- p. 120-149.
Conference
- Title
- applications and related instrumentation.
- Acronym
- 1. workshop on synchrotron light
- Dates
- 25-28 Jul 1988.
- Place
- Campinas, SP (Brazil).
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 22011669
- Subject category
- S36: MATERIALS SCIENCE; S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ATOMS; CRYSTALLOGRAPHY; EPITAXY; GEOMETRY; INDUSTRIAL RADIOGRAPHY; INTERFACES; MOLECULAR BEAMS; SEMICONDUCTOR MATERIALS; SYNCHROTRON RADIATION SOURCES; USES; X-RAY SPECTRA
- Descriptors DEC
- BEAMS; MATERIALS; MATERIALS TESTING; MATHEMATICS; NONDESTRUCTIVE TESTING; RADIATION SOURCES; SPECTRA; TESTING
Optional Information
- Secondary number(s)
- CONF-8807205--.