Published 1996 | Version v1
Book

A pattern-recognition-based, fault-tolerant monitoring and diagnostic technique

  • 1. Idaho Falls, ID (United States)
  • 2. Argonne National Laboratory, IL (United States)

Description

A properly designed monitoring and diagnostic system must be capable of detecting and distinguishing sensor and process malfunctions in the presence of signal noise, varying process states and multiple faults. The technique presented addresses these objectives through the implementation of a multivariate state estimation algorithm based upon pattern recognition methodology coupled with a statistically-based hypothesis test. Utilizing a residual signal vector generated from the difference between the estimated and measured current states of a process, disturbances are detected and identified with statistical hypothesis testing. Since the hypothesis testing utilizes the inherent noise on the signals to obtain a conclusion and the state estimation algorithm requires only a majority of the sensors to be functioning to ascertain the current state, this technique has proven to be quite robust and fault-tolerant. Several examples of its application are presented. (author)

Part of:
SMORN VII

Additional details

Publishing Information

Publisher
Organisation for Economic Co-Operation and Development.
Imprint Place
Paris (France)
Imprint Title
SMORN VII
Imprint Pagination
(v.2) 578 p.
Journal Page Range
p. 414-422.

Conference

Title
Symposium on nuclear reactor surveillance and diagnostics.
Dates
19-23 Jun 1995.
Place
Avignon (France).

INIS

Country of Publication
France
Country of Input or Organization
Nuclear Energy Agency of the OECD (NEA)
INIS RN
29016204
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; S22: GENERAL STUDIES OF NUCLEAR REACTORS;
Resource subtype / Literary indicator
Conference
Descriptors DEI
FAILURES; MEASURING METHODS; MULTIVARIATE ANALYSIS; PATTERN RECOGNITION; REACTOR MONITORING SYSTEMS; RELIABILITY; SYSTEM FAILURE ANALYSIS
Descriptors DEC
MATHEMATICS; STATISTICS; SYSTEMS ANALYSIS

Optional Information

Notes
5 refs.