Published April 1990 | Version v1
Journal article Metadata-only

Seven years of research using the Bruyeres le Chatel microprobe facility: A review

Creators

  • 1. CEA Centre d'Etudes Nucleaires de Saclay, 91 - Gif-sur-Yvette (France). Groupe de Microanalyse Nucleaire
  • 2. Laboratoire d'Analyse par Activation Pierre Sue, Centre d'Etudes Nucleaires de Saclay, 91 - Gif-sur-Yvette (France)

Description

After a brief description of different research topics which have been explored between 1983 and 1988, we show several original results obtained using the Bruyeres le Chatel nuclear microprobe facility. Then we discuss the instrumental improvements carried on in the middle of 1988, by presenting recent works conducted in the new analysis chamber. Finally, looking forward to the starting of the second-generation French nuclear microprobe (beginning of 1991) at Laboratoire Pierre Suee in Saclay, we mention the 1989-1990 research projects of our Nuclear Microanalysis Group. (orig.)

Additional details

Publishing Information

Journal Title
Nuclear Instruments and Methods in Physics Research, Section B
Journal Volume
50
Journal Issue
1-4
Series
Nucl. Instrum. Methods Phys. Res., Sect. B.
Journal Page Range
247-251
ISSN
0168-583X
CODEN
NIMBE

Conference

Title
1. European conference on accelerators in applied research and technology (ECAART-1).
Dates
5-9 Sep 1989.
Place
Frankfurt am Main (Germany, F.R.).

INIS

Country of Publication
Netherlands
Country of Input or Organization
Netherlands
INIS RN
21074084
Subject category
S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
Resource subtype / Literary indicator
Conference, Progress Report
Descriptors DEI
BACKSCATTERING; CHARGE-COUPLED DEVICES; GAMMA DETECTION; HIGH-PURITY GE DETECTORS; ION MICROPROBE ANALYSIS; ION PROBES; NUCLEAR REACTION ANALYSIS; PIXE ANALYSIS; PROGRESS REPORT; RESEARCH PROGRAMS; REVIEWS; RUTHERFORD SCATTERING; SPATIAL DISTRIBUTION
Descriptors DEC
CHEMICAL ANALYSIS; DETECTION; DISTRIBUTION; DOCUMENT TYPES; ELASTIC SCATTERING; GE SEMICONDUCTOR DETECTORS; MEASURING INSTRUMENTS; MICROANALYSIS; NONDESTRUCTIVE ANALYSIS; PROBES; RADIATION DETECTION; RADIATION DETECTORS; SCATTERING; SEMICONDUCTOR DETECTORS; SEMICONDUCTOR DEVICES; X-RAY EMISSION ANALYSIS