Published December 15, 2009 | Version v1
Journal article

Long-term room-temperature relaxation of the defects induced in (Hg,Cd)Te by low-energy ions

  • 1. R and D Institute for Materials SRC 'Carat', 202 Stryjska Street, Lviv 79031 (Ukraine)
  • 2. Ioffe Physical-Technical Institute of the Russian Academy of Sciences, St. Petersburg 194021 (Russian Federation)
  • 3. Institute of Physics, Rzeszow University, 16A Rejtana Street, Rzeszow 35-310 (Poland)
  • 4. Tomsk State University, 36 Lenin Avenue, Tomsk 634050 (Russian Federation)
  • 5. Peter the Great Academy of the Strategic Missile Force, Moscow 109074 (Russian Federation)

Description

The results of the study of relaxation of defects induced in (Hg,Cd)Te by low-energy ions are reported. The treatment was applied to bulk crystals and epitaxial films grown by liquid phase and molecular beam epitaxy. Room-temperature relaxation of defects in the In-, Se-, and vacancy-doped material has been studied. The mechanisms of the formation and relaxation of the defects and their implications to the technology of (Hg,Cd)Te, one of the basic materials for infrared optoelectronics, are considered.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.physb.2009.08.217

Additional details

Identifiers

DOI
10.1016/j.physb.2009.08.217;
PII
S0921-4526(09)00997-1;

Publishing Information

Journal Title
Physica. B, Condensed Matter
Journal Volume
404
Journal Issue
23-24
Journal Page Range
p. 5025-5027
ISSN
0921-4526
CODEN
PHYBE3

Conference

Title
25. international conference on defects in semiconductors
Dates
20-24 Jul 2009
Place
St. Petersburg (Russian Federation)

Optional Information

Copyright
Copyright (c) 2009 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.