Published February 2010
| Version v1
Journal article
Status report of the Dresden EBIS/EBIT developments
Creators
- 1. Institute of Applied Physics, Dresden University of Technology, D-01062 Dresden (Germany)
- 2. Dreebit GmbH, D-01109 Dresden (Germany)
Description
We give an overview about latest developments and measurements with the Dresden electron beam ion source family as compact and economically working table-top sources of highly charged ions. The ion sources are potential tools for various applications such as for use in combination with accelerators in medical particle therapy, as charge breeder or ion trap injector, as ion sources for a new generation of focused ion beam devices and for applications together with time-of-flight secondary mass spectrometers.
Additional details
Identifiers
- DOI
- 10.1063/1.3267846;
Publishing Information
- Journal Title
- Review of Scientific Instruments
- Journal Volume
- 81
- Journal Issue
- 2
- Journal Page Range
- p. 02A512-02A512.3
- ISSN
- 0034-6748
- CODEN
- RSINAK
Conference
- Title
- 13. international conference on ion sources
- Acronym
- ICIS 2009
- Dates
- 20-25 Sep 2009
- Place
- Gatlinburg, TN (United States)
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 44013780
- Subject category
- S43: PARTICLE ACCELERATORS; S62: RADIOLOGY AND NUCLEAR MEDICINE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ACCELERATORS; BEAM INJECTION; ELECTRON BEAM ION SOURCES; FOCUSING; ION BEAMS; RADIOTHERAPY; TIME-OF-FLIGHT MASS SPECTROMETERS
- Descriptors DEC
- BEAMS; DYNAMIC MASS SPECTROMETERS; ION SOURCES; MASS SPECTROMETERS; MEASURING INSTRUMENTS; MEDICINE; NUCLEAR MEDICINE; RADIOLOGY; SPECTROMETERS; THERAPY; TIME-OF-FLIGHT SPECTROMETERS
Optional Information
- Notes
- (c) 2010 American Institute of Physics