Published 1998
| Version v1
Book
Converting films for X-ray detectors, applied to amorphous silicon arrays
Creators
- 1. Argonne National Lab., IL (United States)
- 2. Optical Imaging Systems, inc., Northville, MI (United States)
Description
This paper presents results from the on-going efforts to characterize semiconductor thin films for direct X-ray conversion. The authors deposit these thin films onto an amorphous silicon (a-Si:H) readout array with the overall goal of developing a large area X-ray detector for protein crystallography, and for other X-ray imaging fields
Additional details
Publishing Information
- Publisher
- Materials Research Society
- Imprint Place
- Warrendale, PA (United States)
- ISBN
- 1-55899-392-4
- Imprint Title
- Semiconductors for room-temperature radiation detector applications 2
- Imprint Pagination
- 681 p.
- Series
- Materials Research Society symposium proceedings, Volume 487
- Journal Page Range
- p. 393-397
- ISSN
- 0272-9172
Conference
- Title
- 1997 fall meeting of the Materials Research Society
- Dates
- 1-5 Dec 1997
- Place
- Boston, MA (United States)
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 30034764
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference, Numerical Data
- Descriptors DEI
- CRYSTALLOGRAPHY; EXPERIMENTAL DATA; LEAD IODIDES; READOUT SYSTEMS; SEMICONDUCTOR DETECTORS; SILICON; THIN FILMS; USES; X-RAY DETECTION
- Descriptors DEC
- DATA; DETECTION; ELEMENTS; FILMS; HALIDES; HALOGEN COMPOUNDS; INFORMATION; IODIDES; IODINE COMPOUNDS; LEAD COMPOUNDS; LEAD HALIDES; MEASURING INSTRUMENTS; NUMERICAL DATA; RADIATION DETECTION; RADIATION DETECTORS; SEMIMETALS
Optional Information
- Secondary number(s)
- CONF-971201--