Published May 1, 2018 | Version v1
Journal article

Adaptive pixel-to-pixel projection intensity adjustment for measuring a shiny surface using orthogonal color fringe pattern projection

  • 1. School of Mechanical Engineering, Hebei University of Technology 300130 Tianjin (China)
  • 2. State Key Laboratory of Precision Measuring Technology and Instruments, Tianjin University, Tianjin 300072 (China)

Description

Three-dimensional (3D) shape measurement based on fringe pattern projection techniques has been commonly used in various fields. One of the remaining challenges in fringe pattern projection is that camera sensor saturation may occur if there is a large range of reflectivity variation across the surface that causes measurement errors. To overcome this problem, a novel fringe pattern projection method is proposed to avoid image saturation and maintain high-intensity modulation for measuring shiny surfaces by adaptively adjusting the pixel-to-pixel projection intensity according to the surface reflectivity. First, three sets of orthogonal color fringe patterns and a sequence of uniform gray-level patterns with different gray levels are projected onto a measured surface by a projector. The patterns are deformed with respect to the object surface and captured by a camera from a different viewpoint. Subsequently, the optimal projection intensity at each pixel is determined by fusing different gray levels and transforming the camera pixel coordinate system into the projector pixel coordinate system. Finally, the adapted fringe patterns are created and used for 3D shape measurement. Experimental results on a flat checkerboard and shiny objects demonstrate that the proposed method can measure shiny surfaces with high accuracy. (paper)

Availability note (English)

Available from http://dx.doi.org/10.1088/1361-6501/aab07a

Additional details

Identifiers

Publishing Information

Journal Title
Measurement Science and Technology
Journal Volume
29
Journal Issue
5
Journal Page Range
[15 p.]
ISSN
0957-0233
CODEN
MSTCEP

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
51046696
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Descriptors DEI
ACCURACY; CAMERAS; COLOR; COORDINATES; ERRORS; IMAGES; MODULATION; REFLECTIVITY; SATURATION; SENSORS; SHAPE; SURFACES
Descriptors DEC
OPTICAL PROPERTIES; ORGANOLEPTIC PROPERTIES; PHYSICAL PROPERTIES; SURFACE PROPERTIES