Published January 1979
| Version v1
Report
Restricted
Evaluation of plating thickness standards
Description
Existing aluminum-on-Kapton plating thickness standards have been found adequate to support current requirements when used with the Geiger-Muller detector. Data acquired with a scintillation detector indicate errors could result unless the geometry of the plating thickness standards closely duplicates the part geometry. Synthetic plating thickness standards, artificial standards that duplicate the beta-backscatter response of a thickness of material on a given substrate, were fabricated and evaluated. Because of use limitations, they were judged unsuitable for routine inspection
Availability note (English)
MF available from INIS under the Report Number; Available from NTIS., PC A02/MF A01.
Files
Additional details
Publishing Information
- Imprint Pagination
- 25 p.
- Report number
- BDX--613-1922(Rev.)
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 10448265
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ALUMINIUM; MEASURING METHODS; SPECIFICATIONS; THICKNESS; VAPOR DEPOSITED COATINGS; VAPOR PLATING
- Descriptors DEC
- COATINGS; DEPOSITION; DIMENSIONS; ELEMENTS; METALS; PLATING; SURFACE COATING