Published January 1979 | Version v1
Report Restricted

Evaluation of plating thickness standards

Description

Existing aluminum-on-Kapton plating thickness standards have been found adequate to support current requirements when used with the Geiger-Muller detector. Data acquired with a scintillation detector indicate errors could result unless the geometry of the plating thickness standards closely duplicates the part geometry. Synthetic plating thickness standards, artificial standards that duplicate the beta-backscatter response of a thickness of material on a given substrate, were fabricated and evaluated. Because of use limitations, they were judged unsuitable for routine inspection

Availability note (English)

MF available from INIS under the Report Number; Available from NTIS., PC A02/MF A01.

Files

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Additional details

Publishing Information

Imprint Pagination
25 p.
Report number
BDX--613-1922(Rev.)

INIS

Country of Publication
United States
Country of Input or Organization
United States
INIS RN
10448265
Subject category
S36: MATERIALS SCIENCE;
Descriptors DEI
ALUMINIUM; MEASURING METHODS; SPECIFICATIONS; THICKNESS; VAPOR DEPOSITED COATINGS; VAPOR PLATING
Descriptors DEC
COATINGS; DEPOSITION; DIMENSIONS; ELEMENTS; METALS; PLATING; SURFACE COATING