Aspects of primary creep of a single crystal nickel-base superalloy
- 1. Shenyang Polytechnic Univ. (China)
- 2. Academia Sinica, Shenyang (China). State Key Lab. for Fatigue and Fracture of Materials
- 3. North Eastern Univ., Shenyang (China)
Description
Primary tensile creep curve has been measured for a single crystal nickel-base superalloy and microstructure for specimens parallel to (100) crystal plane at different creep times have been observed by means of transmission electron microscopy (TEM). The results show that the 1/2 left angle 110 right angle dislocation is activated on the octahedral and cube slip systems in the γ matrix channels and multiplied by dislocation reactions. The dislocation motion must overcome greater resistance on the (100) and (010) crystal planes in the γ matrix channels which are subjected to compression stress. Therefore, the bulk dislocations move in a form of cross-slip and shorter distance. The dislocation loop in one matrix channel moves into the other matrix channels subjected to compression stress by means of cross-slip that is similar to Frank-Read (F-R) dislocation configuration due to the pinning on both sides. After the γ' is rafted, the climbing of dislocations is the principal mechanism of the creep deformation. (orig.)
Additional details
Publishing Information
- Journal Title
- Materials Science and Engineering. A, Structural Materials: Properties, Microstructure and Processing
- Journal Volume
- 262
- Journal Issue
- 1-2
- Journal Page Range
- p. 271-278
- ISSN
- 0921-5093
- CODEN
- MSAPE3
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- Switzerland
- INIS RN
- 30030846
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ALUMINIUM ALLOYS; CHROMIUM ALLOYS; CREEP; DISLOCATION PINNING; DISLOCATIONS; MOLYBDENUM ALLOYS; NICKEL ALLOYS; SLIP; SURFACES; TANTALUM ALLOYS; TOPOGRAPHY; TRANSMISSION ELECTRON MICROSCOPY
- Descriptors DEC
- ALLOYS; CRYSTAL DEFECTS; CRYSTAL STRUCTURE; ELECTRON MICROSCOPY; LINE DEFECTS; MECHANICAL PROPERTIES; MICROSCOPY; TRANSITION ELEMENT ALLOYS
Optional Information
- Notes
- 12 refs.