Published July 1994
| Version v1
Journal article
X-ray dosimetry using a Cd sulphide photoresistor
Description
The performance of a Cd sulphide photoresistor as an X-ray dosimeter has been investigated. This general-purpose device which is typically used in photometry applications is low cost, of small size and of stable characteristics. Although the device is primarily designed for visible radiation, it was found that its sensitivity in the X-ray region is acceptable and its response with the incident X-ray intensity is linear. The device was found to give results with an accuracy better than ± 10% for dose rates greater than 35 R/h. The low-cost, small size acceptable sensitivity and linearity makes the Cd sulphide photoresistor a very suitable device for X-ray dosimetry. (Author)
Additional details
Publishing Information
- Journal Title
- Radiation Physics and Chemistry (1993)
- Journal Volume
- 44
- Journal Issue
- 1-2
- Journal Page Range
- p. 61-62.
- ISSN
- 0969-806X
- CODEN
- RPCHDM
Conference
- Title
- 1. radiation physics conference.
- Dates
- 15-19 Nov 1992.
- Place
- Qena (Egypt).
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- United Kingdom
- INIS RN
- 28034769
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ACCURACY; CADMIUM SULFIDES; COST; DOSE RATES; ELECTRIC CURRENTS; PERFORMANCE; PHOTORESISTORS; SENSITIVITY; X-RAY DOSIMETRY
- Descriptors DEC
- CADMIUM COMPOUNDS; CHALCOGENIDES; CURRENTS; DOSIMETRY; ELECTRICAL EQUIPMENT; EQUIPMENT; RESISTORS; SULFIDES; SULFUR COMPOUNDS