An effective scatter correction method based on single scatter simulation for a 3D whole-body PET scanner
- 1. State Key Laboratory of Modern Optical Instrumentation, Zhejiang University, Hangzhou 310027 (China)
- 2. Central Research Laboratory, Hamamatsu Photonics K.K., Hamamatsu 434–8601 (Japan)
Description
Hamamatsu SHR74000 is a newly designed full three-dimensional (3D) whole body positron emission tomography (PET) scanner with small crystal size and large field of view (FOV). With the improvement of sensitivity, the scatter events increase significantly at the same time, especially for large objects. Monte Carlo simulations help us to understand the scatter phenomena and provide good references for scatter correction. In this paper, we introduce an effective scatter correction method based on single scatter simulation for the new PET scanner, which accounts for the full 3D scatter correction. With the results from Monte Carlo simulations, we implement a new scale method with special concentration on scatter events from outside the axial FOV and multiple scatter events. The effects of scatter correction are investigated and evaluated by phantom experiments; the results show good improvements in quantitative accuracy and contrast of the images, even for large objects. (condensed matter: electronic structure, electrical, magnetic, and optical properties)
Availability note (English)
Available from http://dx.doi.org/10.1088/1674-1056/18/7/076Additional details
Identifiers
Publishing Information
- Journal Title
- Chinese Physics. B
- Journal Volume
- 18
- Journal Issue
- 7
- Journal Page Range
- p. 3066-3072
- ISSN
- 1674-1056
INIS
- Country of Publication
- China
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 45007429
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- COMPUTERIZED SIMULATION; CONCENTRATION RATIO; CORRECTIONS; CRYSTALS; IMAGES; MONTE CARLO METHOD; OPTICAL PROPERTIES; PHANTOMS; POSITRON COMPUTED TOMOGRAPHY; SENSITIVITY
- Descriptors DEC
- CALCULATION METHODS; COMPUTERIZED TOMOGRAPHY; DIAGNOSTIC TECHNIQUES; DIMENSIONLESS NUMBERS; EMISSION COMPUTED TOMOGRAPHY; MOCKUP; PHYSICAL PROPERTIES; SIMULATION; STRUCTURAL MODELS; TOMOGRAPHY