Published July 20, 2004
| Version v1
Journal article
Assessing mesoscale material response via high-resolution line-imaging VISAR
- 1. Sandia National Laboratories, P.O. Box 5800, Albuquerque NM 87185 (United States)
- 2. Ktech Corp, 2201 Buena Vista SE, Ste 400, Albuquerque, NM 87106-4265 (United States)
Description
Of special promise for providing dynamic mesoscale response data is the line-imaging VISAR, an instrument for providing spatially resolved velocity histories in dynamic experiments. We have prepared a line-imaging VISAR system capable of spatial resolution in the 10 - 20 micron range. We are applying this instrument to selected experiments on a compressed gas gun, chosen to provide initial data for several problems of interest, including: (1) pore-collapse in single-crystal copper (70 micron diameter hole; 2 different versions); and (2) response of a welded joint in dissimilar materials (Ta, Nb) to ramp loading relative to that of a compression joint
Additional details
Identifiers
- DOI
- 10.1063/1.1780444;
Publishing Information
- Journal Title
- AIP Conference Proceedings
- Journal Volume
- 706
- Journal Issue
- 1
- Journal Page Range
- p. 1159-1162
- ISSN
- 0094-243X
- CODEN
- APCPCS
Conference
- Title
- American Physical Society Topical Group conference on shock compression of condensed matter
- Dates
- 20-25 Jul 2003
- Place
- Portland, OR (United States)
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 36010054
- Subject category
- S36: MATERIALS SCIENCE; S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- COMPRESSION; COPPER; GUNS; INTERFEROMETERS; MATERIALS TESTING; MONOCRYSTALS; NIOBIUM; SHOCK WAVES; SPATIAL RESOLUTION; STREAK CAMERAS; TANTALUM; VELOCITY; WELDED JOINTS
- Descriptors DEC
- CAMERAS; CRYSTALS; ELEMENTS; JOINTS; MEASURING INSTRUMENTS; METALS; REFRACTORY METALS; RESOLUTION; TESTING; TRANSITION ELEMENTS
Optional Information
- Notes
- (c) 2004 American Institute of Physics