Published March 2007 | Version v1
Journal article

Measurement of friction coefficients with the atomic force microscope

  • 1. School of Chemistry F11, University of Sydney, NSW 2006 (Australia)
  • 2. Department of Surface Chemistry, Royal Institute of Technology, SE-100 44 Stockholm, Sweden and Institute for Surface Chemistry, Box 5607, SE-114 86 Stockholm, Sweden (Sweden)

Description

A new axial method for measuring the friction coefficient with the atomic force microscope is given. This axial method requires no calibration steps and is performed simultaneously with a normal force measurement by measuring the difference between the constant compliance slopes of the extend and retract force curves. The algorithm can be applied retrospectively to extract the friction coefficient from preexisting force measurements. Results are in quantitative agreement with the more established lateral method. The method can be used for both tipped cantilevers and for attached spherical probes

Additional details

Identifiers

Publishing Information

Journal Title
Journal of Physics. Conference Series (Online)
Journal Volume
61
Journal Issue
1
Journal Page Range
p. 51-55
ISSN
1742-6596

Conference

Title
International conference on nanoscience and technology
Dates
30 Jul - 4 Aug 2006
Place
Basel (Switzerland)

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
38077899
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ALGORITHMS; ATOMIC FORCE MICROSCOPY; CALIBRATION; FRICTION FACTOR; MEASURING METHODS; PROBES; SPHERICAL CONFIGURATION
Descriptors DEC
CONFIGURATION; DIMENSIONLESS NUMBERS; MATHEMATICAL LOGIC; MICROSCOPY