Published March 1, 2010 | Version v1
Journal article

Evaluation of the quality of the etching process with the piezoelectric spectroscopy method

  • 1. Department of Electronics and Computer Science Technical University of Koszalin2 Sniadeckich St, 75-453 Koszalin (Poland)
  • 2. Instytut Fizyki, Uniwersytet Mikolaja Kopernika, ul.Grudziadzka 5/7, 87-100 Torun (Poland)

Description

This paper is the presentation of photothermal piezoelectric studies of the optical properties performed on a series of AII-BVI mixed crystals. This approach enables not only determination of the basic optical parameters of mixed crystals such as the energy gap value or Urbach edge parameters but it also turned out to be a useful tool for investigations of the surface quality of the samples.

Availability note (English)

Available from http://dx.doi.org/10.1088/1742-6596/214/1/012069

Additional details

Publishing Information

Journal Title
Journal of Physics. Conference Series (Online)
Journal Volume
214
Journal Issue
1
Journal Page Range
[4 p.]
ISSN
1742-6596

Conference

Title
15. international conference on photoacoustic and photothermal phenomena
Acronym
ICPPP15
Dates
19-23 Jul 2009
Place
Leuven (Belgium)

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
42044505
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
CRYSTALS; ENERGY GAP; ETCHING; OPTICAL PROPERTIES; PHOTOACOUSTIC SPECTROSCOPY; PIEZOELECTRICITY; SURFACES
Descriptors DEC
ELECTRICITY; PHYSICAL PROPERTIES; SPECTROSCOPY; SURFACE FINISHING