Published March 1, 2010
| Version v1
Journal article
Evaluation of the quality of the etching process with the piezoelectric spectroscopy method
Creators
- 1. Department of Electronics and Computer Science Technical University of Koszalin2 Sniadeckich St, 75-453 Koszalin (Poland)
- 2. Instytut Fizyki, Uniwersytet Mikolaja Kopernika, ul.Grudziadzka 5/7, 87-100 Torun (Poland)
Description
This paper is the presentation of photothermal piezoelectric studies of the optical properties performed on a series of AII-BVI mixed crystals. This approach enables not only determination of the basic optical parameters of mixed crystals such as the energy gap value or Urbach edge parameters but it also turned out to be a useful tool for investigations of the surface quality of the samples.
Availability note (English)
Available from http://dx.doi.org/10.1088/1742-6596/214/1/012069Additional details
Identifiers
Publishing Information
- Journal Title
- Journal of Physics. Conference Series (Online)
- Journal Volume
- 214
- Journal Issue
- 1
- Journal Page Range
- [4 p.]
- ISSN
- 1742-6596
Conference
- Title
- 15. international conference on photoacoustic and photothermal phenomena
- Acronym
- ICPPP15
- Dates
- 19-23 Jul 2009
- Place
- Leuven (Belgium)
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 42044505
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- CRYSTALS; ENERGY GAP; ETCHING; OPTICAL PROPERTIES; PHOTOACOUSTIC SPECTROSCOPY; PIEZOELECTRICITY; SURFACES
- Descriptors DEC
- ELECTRICITY; PHYSICAL PROPERTIES; SPECTROSCOPY; SURFACE FINISHING