Light-material interactions in laser material processing
Description
The authors discusses how light interactions with materials in laser material processing operations occur by a variety of mechanisms depending on the material being processed, the wavelength of the laser light, the gaseous environment, and the physical state of the material surface. The high reflectivity of metals limits the fraction of the beam power absorbed by the solid metal surface. For metals in the solid state, reflectivity increases as the wavelength of the laser light and the electrical conductivity of the metal increase. The reflectivity of metals is reduced upon heating to the melting point, and further reduced upon melting. At high power densities the liquid metal surface is heated so quickly that very rapid vaporization occurs. The recoil force produced by the evaporation causes a depression in the liquid/vapor interface. The keyhole resulting from this depression allows for multiple reflections and thus increases beam absorption in the liquid
Additional details
Publishing Information
- Publisher
- Society of Automotive Engineers.
- Imprint Place
- Warrendale, PA (USA)
- Imprint Title
- The use of lasers in manufacturing
- Imprint Pagination
- 124 p.
- Journal Page Range
- p. 95-110.
Conference
- Title
- technical conference and exposition.
- Acronym
- Society of Automotive Engineers (SAE) aerotech '89
- Dates
- 25-28 Sep 1989.
- Place
- Anaheim, CA (USA).
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 21077132
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; S73: NUCLEAR PHYSICS AND RADIATION PHYSICS;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ABSORPTION SPECTRA; BEAM OPTICS; ELECTRIC CONDUCTIVITY; EVAPORATION; INTERACTIONS; LASER RADIATION; LIQUID METALS; MATERIALS; POLARIZATION; RADIATION SCATTERING ANALYSIS; REFLECTION; SHIELDING; SOLID-STATE PLASMA
- Descriptors DEC
- CHEMICAL ANALYSIS; ELECTRICAL PROPERTIES; ELECTROMAGNETIC RADIATION; ELEMENTS; FLUIDS; LIQUIDS; METALS; NONDESTRUCTIVE ANALYSIS; PHASE TRANSFORMATIONS; PHYSICAL PROPERTIES; PLASMA; RADIATIONS; SPECTRA
Optional Information
- Secondary number(s)
- CONF-8909168--.