Published August 1989
| Version v1
Journal article
The determination of trace elements in silicon carbide
- 1. Institut fuer Spektrochemie und Angewandte Spektroskopie, Dortmund (Germany, F.R.)
- 2. Max-Planck-Institut fuer Metallforschung, Stuttgart (Germany, F.R.). Lab. fuer Reinstoffanalytik
Description
Published in summary form only
Additional details
Publishing Information
- Journal Title
- Fresenius' Zeitschrift fuer Analytische Chemie
- Journal Volume
- 334
- Journal Issue
- 7
- Series
- Fresenius' Z. Anal. Chem.
- Journal Page Range
- 631-632
- ISSN
- 0016-1152
- CODEN
- ZACFA
Conference
- Title
- 11. international symposium on microchemical techniques (ISM-11) and exhibition.
- Dates
- 28 Aug - 1 Sep 1989.
- Place
- Wiesbaden (Germany, F.R.).
INIS
- Country of Publication
- Germany
- Country of Input or Organization
- Germany
- INIS RN
- 20083237
- Subject category
- S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
- Resource subtype / Literary indicator
- Conference, No Abstract
- Descriptors DEI
- ABSORPTION SPECTROSCOPY; EMISSION SPECTROSCOPY; IMPURITIES; POWDERS; QUANTITATIVE CHEMICAL ANALYSIS; SAMPLE PREPARATION; SILICON CARBIDES
- Descriptors DEC
- CARBIDES; CARBON COMPOUNDS; CHEMICAL ANALYSIS; SILICON COMPOUNDS; SPECTROSCOPY