Atomic layer deposition of AlN on graphene
Creators
- 1. Institute of Electronics, Bulgarian Academy of Sciences, Sofia, 1784 (Bulgaria)
- 2. Department of Physics, Chemistry and Biology, Linköping University, Linköping, SE-58183 (Sweden)
- 3. Institute of General and Inorganic Chemistry, Bulgarian Academy of Sciences, Sofia, 1113 (Bulgaria)
Description
Graphene is a material with great promise for several applications within electronics. However, using graphene in any such application requires its integration in a stack of thin layers of materials. The ideal structure of graphene has a fully saturated surface without any binding sites for chemisorption of growth species, making film growth on graphene highly challenging. Herein, an attempt to deposit very thin layers of AlN using an atomic layer deposition approach is reported. It is demonstrated using X-ray photoelectron spectroscopy that Al-N are formed in the films deposited on graphene and shown by scanning electron microscopy and atomic force microscopy that the films have an island morphology. These results may be considered promising toward the development of a growth protocol for AlN on graphene and possibly also for 2D AlN fabrication. (© 2021 Wiley‐VCH GmbH)
Additional details
Identifiers
Publishing Information
- Journal Title
- Physica Status Solidi. A, Applications and Materials Science (Online)
- Journal Volume
- 218
- Journal Issue
- 17
- Journal Page Range
- p. 1-6
- ISSN
- 1862-6319
- CODEN
- PSSABA
INIS
- Country of Publication
- Germany
- Country of Input or Organization
- Germany
- INIS RN
- 52109006
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ALUMINIUM NITRIDES; ATOMIC FORCE MICROSCOPY; BINDING ENERGY; CHEMISORPTION; CRYSTAL GROWTH; DEPOSITION; FABRICATION; GRAPHENE; MORPHOLOGY; NUCLEATION; ROUGHNESS; SCANNING ELECTRON MICROSCOPY; SILICON CARBIDES; THIN FILMS; TWO-DIMENSIONAL SYSTEMS; X-RAY PHOTOELECTRON SPECTROSCOPY
- Descriptors DEC
- ALUMINIUM COMPOUNDS; CARBIDES; CARBON; CARBON COMPOUNDS; CHEMICAL REACTIONS; CRYSTAL LATTICES; CRYSTAL STRUCTURE; ELECTRON MICROSCOPY; ELECTRON SPECTROSCOPY; ELEMENTS; ENERGY; FILMS; MICROSCOPY; NITRIDES; NITROGEN COMPOUNDS; NONMETALS; PHOTOELECTRON SPECTROSCOPY; PNICTIDES; SEPARATION PROCESSES; SILICON COMPOUNDS; SORPTION; SPECTROSCOPY; SURFACE PROPERTIES
Optional Information
- Notes
- AID: 2000684