Published May 2014
| Version v1
Journal article
Formation of axial metal–semiconductor junctions in GaAs nanowires by thermal annealing
Creators
- 1. Istituto Officina dei Materiali – CNR, Basovizza SS 14 km 163.5, I-34149 Trieste (Italy)
Description
We demonstrate the formation of nanoscale axial Schottky contacts in GaAs nanowires by thermal annealing of NiGeAu multilayers. Energy dispersive x-ray spectroscopy indicates that in specific annealing conditions a sharply-defined Au-rich phase can be obtained in the vicinity of the metallic contacts. Charge transport characteristics are analyzed for different degrees of diffusion of the Au-rich phase in the wire and indicate that it has a metallic nature. The mechanism behind this local post-growth modification of the nanowire composition and its potential impact on device applications are discussed. (paper)
Availability note (English)
Available from http://dx.doi.org/10.1088/0268-1242/29/5/054001Additional details
Identifiers
Publishing Information
- Journal Title
- Semiconductor Science and Technology
- Journal Volume
- 29
- Journal Issue
- 5
- Journal Page Range
- [7 p.]
- ISSN
- 0268-1242
- CODEN
- SSTEET
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 46083647
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- ANNEALING; CHARGE TRANSPORT; DIFFUSION; GALLIUM ARSENIDES; GERMANIUM; GOLD; INTERMETALLIC COMPOUNDS; MODIFICATIONS; NANOWIRES; NICKEL; SEMICONDUCTOR JUNCTIONS; X-RAY SPECTROSCOPY
- Descriptors DEC
- ALLOYS; ARSENIC COMPOUNDS; ARSENIDES; ELEMENTS; GALLIUM COMPOUNDS; HEAT TREATMENTS; METALS; NANOSTRUCTURES; PNICTIDES; SPECTROSCOPY; TRANSITION ELEMENTS