Published September 16, 1974
| Version v1
Journal article
New factors affecting the measured lifetime of electrons trapped on vortex lines in He II
Creators
- 1. Department of Physics, University of California, Berkeley, California 94720
Description
The lifetime of trapped electrons measured at $T<1.5$ K is found to be affected by factors which should not influence the intrinsic ion-vortex-line interaction. Observations indicate that the vortex lines move in the container, and the trapped charge escapes when the vortex lines interact with the container wall.
Additional details
Identifiers
Publishing Information
- Journal Title
- Physical Review Letters
- Journal Volume
- 33
- Journal Issue
- 12
- Series
- Phys. Rev. Lett.
- Journal Page Range
- 683-685
- ISSN
- 0031-9007
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 6167292
- Subject category
- S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS;
- Descriptors DEI
- HALF-LIFE; HELIUM II; TRAPPED ELECTRONS; ULTRALOW TEMPERATURE; VORTEX FLOW
- Descriptors DEC
- ELECTRONS; ELEMENTARY PARTICLES; EVEN-EVEN NUCLEI; FERMIONS; FLUID FLOW; HELIUM ISOTOPES; HELIUM 4; ISOTOPES; LEPTONS; LIGHT NUCLEI; NUCLEI; STABLE ISOTOPES
Optional Information
- Notes
- Updated automatically by Metadata and Full-Text Enrichment Agent