Published September 16, 1974 | Version v1
Journal article

New factors affecting the measured lifetime of electrons trapped on vortex lines in He II

  • 1. Department of Physics, University of California, Berkeley, California 94720

Description

The lifetime of trapped electrons measured at $T<1.5$ K is found to be affected by factors which should not influence the intrinsic ion-vortex-line interaction. Observations indicate that the vortex lines move in the container, and the trapped charge escapes when the vortex lines interact with the container wall.

Additional details

Identifiers

Publishing Information

Journal Title
Physical Review Letters
Journal Volume
33
Journal Issue
12
Series
Phys. Rev. Lett.
Journal Page Range
683-685
ISSN
0031-9007

INIS

Country of Publication
United States
Country of Input or Organization
United States
INIS RN
6167292
Subject category
S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS;
Descriptors DEI
HALF-LIFE; HELIUM II; TRAPPED ELECTRONS; ULTRALOW TEMPERATURE; VORTEX FLOW
Descriptors DEC
ELECTRONS; ELEMENTARY PARTICLES; EVEN-EVEN NUCLEI; FERMIONS; FLUID FLOW; HELIUM ISOTOPES; HELIUM 4; ISOTOPES; LEPTONS; LIGHT NUCLEI; NUCLEI; STABLE ISOTOPES

Optional Information

Notes
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