Effect of GLAD technique on optical properties of ZnS multilayer antireflection coatings
- 1. Thin Film Lab, Faculty of Physics, Semnan University, Semnan, 35195-363 (Iran, Islamic Republic of)
Description
Highlights: • ZnS multi-layer antireflection coatings have been prepared by GLAD technique. • XRD analysis depicts that all the multi-layer samples are crystallized in cubic structure. • FESEM images confirmed the multi-layer and inclined formation of specimens. • Transmission increment and refractive index decrement obtained for the multi-layer samples. • Incredible impression of GLAD technique on multi-layer coatings is realized. - Abstract: In this work, we prepared Zinc sulfide (ZnS) multi-layer antireflection coatings applying glancing angle deposition (GLAD) technique by physical vapor deposition method. By comparing the structural and optical properties of the samples prepared at normal and inclined single layer coatings, salient effect of multi-layer coatings composed of normal and inclined layers are observed. Relative improvement in crystallinity of the GLAD produced films with respect to inclined single layer resulted from X-ray diffraction (XRD) studies. Despite high increment in average transmission, explicit reduction in refractive index of the multilayer specimens are obtained by Ultraviolet–visible spectroscopy (UV–VIS) analysis. Both the abovementioned changes are in the direction of improving the anti-reflectivity features.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.materresbull.2017.12.037Additional details
Identifiers
- DOI
- 10.1016/j.materresbull.2017.12.037;
- PII
- S0025540817333147;
Publishing Information
- Journal Title
- Materials Research Bulletin
- Journal Volume
- 100
- Journal Page Range
- p. 265-274
- ISSN
- 0025-5408
- CODEN
- MRBUAC
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 50048322
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ANTIREFLECTION COATINGS; PHYSICAL VAPOR DEPOSITION; REFRACTIVE INDEX; SCANNING ELECTRON MICROSCOPY; SPECTROSCOPY; THIN FILMS; ULTRAVIOLET RADIATION; X-RAY DIFFRACTION; ZINC SULFIDES
- Descriptors DEC
- CHALCOGENIDES; COATINGS; COHERENT SCATTERING; DEPOSITION; DIFFRACTION; ELECTROMAGNETIC RADIATION; ELECTRON MICROSCOPY; FILMS; INORGANIC PHOSPHORS; MICROSCOPY; OPTICAL PROPERTIES; PHOSPHORS; PHYSICAL PROPERTIES; RADIATIONS; SCATTERING; SULFIDES; SULFUR COMPOUNDS; SURFACE COATING; ZINC COMPOUNDS
Optional Information
- Copyright
- Copyright (c) 2017 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.