Published January 1999 | Version v1
Journal article

Recent progress in high-energy, high-resolution x-ray imaging techniques for application to the National Ignition Facility (invited)

  • 1. Lawrence Livermore National Laboratory, L-021, Livermore California, 94550 (United States)
  • 2. Naval Research Laboratory, Washington DC, 20375 (United States)
  • 3. Science Applications International Corporation, McLean, Virginia 22102 (United States)

Description

Multi-keV x-ray microscopy will be an important laser-produced plasma diagnostic at future megajoule facilities such as the National Ignition Facility (NIF). However, laser energies and plasma characteristics imply that x-ray microscopy will be more challenging at NIF than at existing facilities. In earlier work, we concluded that target-mounted pinholes and single spherical or toroidal crystals are good options for many x-ray microscopy applications at NIF. In this article, we review the experimental progress we have made investigating these systems on the Nova and Petawatt Laser Facilities. In particular, we have performed high-resolution, high-magnification target-mounted pinhole imaging of Nova implosions, and we have obtained promising preliminary spherical-crystal data from high-intensity Petawatt experiments. We are also designing a high-energy spherical-crystal imager for use on Nova experiments. copyright 1999 American Institute of Physics

Additional details

Publishing Information

Journal Title
Review of Scientific Instruments
Journal Volume
70
Journal Issue
1
Journal Page Range
p. 525-529
ISSN
0034-6748
CODEN
RSINAK

Conference

Title
12. topical conference on high-temperature plasma diagnostics
Dates
7-11 Jun 1998
Place
Princeton, NJ (United States)

INIS

Country of Publication
United States
Country of Input or Organization
United States
INIS RN
30011086
Subject category
S70: PLASMA PHYSICS AND FUSION TECHNOLOGY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
IMAGES; PLASMA DIAGNOSTICS; RESOLUTION; THERMONUCLEAR IGNITION; X-RAY EMISSION ANALYSIS; X-RAY EQUIPMENT
Descriptors DEC
CHEMICAL ANALYSIS; EQUIPMENT; NONDESTRUCTIVE ANALYSIS

Optional Information

Secondary number(s)
CONF-980605--