Recent progress in high-energy, high-resolution x-ray imaging techniques for application to the National Ignition Facility (invited)
- 1. Lawrence Livermore National Laboratory, L-021, Livermore California, 94550 (United States)
- 2. Naval Research Laboratory, Washington DC, 20375 (United States)
- 3. Science Applications International Corporation, McLean, Virginia 22102 (United States)
Description
Multi-keV x-ray microscopy will be an important laser-produced plasma diagnostic at future megajoule facilities such as the National Ignition Facility (NIF). However, laser energies and plasma characteristics imply that x-ray microscopy will be more challenging at NIF than at existing facilities. In earlier work, we concluded that target-mounted pinholes and single spherical or toroidal crystals are good options for many x-ray microscopy applications at NIF. In this article, we review the experimental progress we have made investigating these systems on the Nova and Petawatt Laser Facilities. In particular, we have performed high-resolution, high-magnification target-mounted pinhole imaging of Nova implosions, and we have obtained promising preliminary spherical-crystal data from high-intensity Petawatt experiments. We are also designing a high-energy spherical-crystal imager for use on Nova experiments. copyright 1999 American Institute of Physics
Additional details
Publishing Information
- Journal Title
- Review of Scientific Instruments
- Journal Volume
- 70
- Journal Issue
- 1
- Journal Page Range
- p. 525-529
- ISSN
- 0034-6748
- CODEN
- RSINAK
Conference
- Title
- 12. topical conference on high-temperature plasma diagnostics
- Dates
- 7-11 Jun 1998
- Place
- Princeton, NJ (United States)
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 30011086
- Subject category
- S70: PLASMA PHYSICS AND FUSION TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- IMAGES; PLASMA DIAGNOSTICS; RESOLUTION; THERMONUCLEAR IGNITION; X-RAY EMISSION ANALYSIS; X-RAY EQUIPMENT
- Descriptors DEC
- CHEMICAL ANALYSIS; EQUIPMENT; NONDESTRUCTIVE ANALYSIS
Optional Information
- Secondary number(s)
- CONF-980605--