Published February 15, 2012 | Version v1
Journal article

Monte Carlo simulations of channeling spectra recorded for samples containing complex defects

  • 1. Andrzej Soltan Institute for Nuclear Studies, 05-400 Swierk/Otwock (Poland)
  • 2. Institute for Electronic Materials Technology, 01-919 Warszawa (Poland)
  • 3. Environmental Molecular Science Laboratory, Richland, WA 99352 (United States)
  • 4. Oak Ridge National Laboratory, Oak Ridge, TN 37831-6138 (United States)
  • 5. Centre de Spectrométrie Nucléaire et de Spectrométrie de Masse, IN2P3, Université Paris-Sud, 91400 Orsay (France)

Description

The aim of the present paper is to describe the current status of the development of McChasy, a Monte Carlo simulation code, to make it suitable for the analysis of dislocations and dislocation loops in crystals. Such factors like the shape of the bent channel and geometrical distortions of the crystalline structure in the vicinity of dislocation has been discussed. The results obtained demonstrate that the new procedure applied to the spectra recorded on crystals containing dislocation yields damage profiles which are independent of the energy of the analyzing beam.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.nimb.2011.07.047

Additional details

Identifiers

DOI
10.1016/j.nimb.2011.07.047;
PII
S0168-583X(11)00691-4;

Publishing Information

Journal Title
Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
Journal Volume
273
Journal Page Range
p. 91-94
ISSN
0168-583X
CODEN
NIMBEU

Conference

Title
20. international conference on ion beam analysis
Dates
10-15 Apr 2011
Place
Itapema (Brazil)

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
44034131
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
BEAMS; CHANNELING; COMPUTERIZED SIMULATION; CRYSTAL DEFECTS; CRYSTALS; DISLOCATIONS; MONTE CARLO METHOD; SPECTRA; YIELDS
Descriptors DEC
CALCULATION METHODS; CRYSTAL DEFECTS; CRYSTAL STRUCTURE; LINE DEFECTS; SIMULATION

Optional Information

Copyright
Copyright (c) 2011 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.