Development of high brightness soft x-ray source based on inverse compton scattering
- 1. Waseda Univ., Advanced Research Institute for Science Engineering, Tokyo (Japan)
Description
Compact soft x-ray source based on inverse compton scattering have been developed at Waseda University. Using 1047 nm laser light from Nd:YLF laser scattered off 4.2 MeV electron beam generated from a photo-cathode rf-gun, we have already succeeded to generate the soft x-ray. The energy of this x-ray is included in the part of water window, in which absorption by water is much less than that of moleculars that organize a living body. Furthermore, this x-ray source has other features such as short pulse, proportional mono-energy and energy variableness. Because of these features, the application to the biological microscope has been expected. However, the flux of x-ray is not satisfied for the biological microscope application. Therefore, to multiply a soft x-ray flux, we utilized multi-pass amplifier for the laser light and improved a collision chamber. In this conference, we will report the experimental results and future plans. (author)
Additional details
Identifiers
- URL
- http://www.pasj.jp/;
Publishing Information
- Imprint Title
- The 3rd annual meeting of Particle Accelerator Society of Japan and the 31th Linear Accelerator Meeting in Japan. Proceedings
- Imprint Pagination
- 819 p.
- Journal Page Range
- p. 708-710
Conference
- Title
- 3. annual meeting of Particle Accelerator Society of Japan; 31. Linear Accelerator Meeting in Japan
- Dates
- 2-4 Aug 2006
- Place
- Sendai, Miyagi (Japan)
INIS
- Country of Publication
- Japan
- Country of Input or Organization
- Japan
- INIS RN
- 41018039
- Subject category
- S43: PARTICLE ACCELERATORS; S62: RADIOLOGY AND NUCLEAR MEDICINE;
- Resource subtype / Literary indicator
- Conference, Non-conventional Literature
- Descriptors DEI
- BACKGROUND RADIATION; BRIGHTNESS; CAVITY RESONATORS; COMPTON EFFECT; ELECTRON BEAMS; ELECTRON GUNS; INVERSE SCATTERING PROBLEM; LASERS; RF SYSTEMS; SOFT X RADIATION; SPECIFICATIONS; X-RAY SOURCES
- Descriptors DEC
- BASIC INTERACTIONS; BEAMS; ELASTIC SCATTERING; ELECTROMAGNETIC INTERACTIONS; ELECTROMAGNETIC RADIATION; ELECTRONIC EQUIPMENT; EQUIPMENT; INTERACTIONS; IONIZING RADIATIONS; LEPTON BEAMS; OPTICAL PROPERTIES; PARTICLE BEAMS; PHYSICAL PROPERTIES; RADIATION SOURCES; RADIATIONS; RESONATORS; SCATTERING; X RADIATION
Optional Information
- Notes
- 5 refs., 6 figs., 1 tab.