Published July 2016 | Version v1
Journal article

Electronic spectrum of Bi-related defects in crystalline CdTe

  • 1. National Research Nuclear University MEPhI, 115409 Moscow (Russian Federation)
  • 2. P.N. Lebedev Physical Institute, Russian Academy of Sciences, 119991 Moscow (Russian Federation)

Description

Using measurements of conductivity and low-temperature photoluminescence, we have studied electronic levels in the band gap of CdTe:Bi and CdTe:Bi,Cl single crystals grown by the modified Bridgman technique. Three type of deep levels (EV+0.29 eV, EV+0.4 eV, EV+0.72 eV) and Bi-related shallow acceptor have been observed depending on the doping conditions. Energy spectrum of a shallow Bi-related acceptor has been measured and its low symmetry has been established. The tentative interpretation for all the levels observed has been proposed. (copyright 2016 WILEY-VCH Verlag GmbH and Co. KGaA, Weinheim)

Availability note (English)

Available from: http://dx.doi.org/10.1002/pssc.201510274

Additional details

Identifiers

Publishing Information

Journal Title
Physica Status Solidi. C, Current Topics in Solid State Physics (Online)
Journal Volume
13
Journal Issue
7-9
Journal Page Range
p. 481-485
ISSN
1610-1642

Conference

Title
17. International conference on II-VI compounds and related materials
Acronym
II-VI 2015
Dates
13-18 Sep 2015
Place
Paris (France)

Optional Information

Notes
With 4 figs., 2 tabs., 18 refs.