Published January 2009 | Version v1
Journal article

Dispersion relations for plasmon excitations in nanostructures of different shapes and symmetries

  • 1. Centro Atomico Bariloche and Instituto Balseiro, Comision Nacional de Energia Atomica (CNEA) and Universidad Nacional de Cuyo (UNC), 8400 S. C. de Bariloche, Rio Negro (Argentina)

Description

We give a short overview of the dispersion relation for plasmon excitations in nanosystems of spherical (spheres, cavities and concentric spherical shells) and cylindrical (capillaries, wires and tubes) symmetries. We describe the interaction of external charged particles with the nanomaterials by using the dielectric response function. We apply the calculation to the case of electrons impacting nanosurfaces of Aluminum. We show how different is the response of the surface depending of its shape and configuration.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.nimb.2008.11.030

Additional details

Identifiers

DOI
10.1016/j.nimb.2008.11.030;
PII
S0168-583X(08)01303-7;

Publishing Information

Journal Title
Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
Journal Volume
267
Journal Issue
2
Journal Page Range
p. 235-238
ISSN
0168-583X
CODEN
NIMBEU

Conference

Title
4. international conference on elementary processes in atomic systems
Dates
18-20 Jun 2008
Place
Cluj-Napoca (Romania)

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
41018456
Subject category
S77: NANOSCIENCE AND NANOTECHNOLOGY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ALUMINIUM; CAVITIES; CHARGED PARTICLES; CYLINDRICAL CONFIGURATION; DIELECTRIC MATERIALS; DISPERSION RELATIONS; ELECTRONS; EXCITATION; NANOSTRUCTURES; PLASMONS; RESPONSE FUNCTIONS; SHAPE; SPHERICAL CONFIGURATION; SYMMETRY
Descriptors DEC
CONFIGURATION; ELEMENTARY PARTICLES; ELEMENTS; ENERGY-LEVEL TRANSITIONS; FERMIONS; FUNCTIONS; LEPTONS; MATERIALS; METALS; QUASI PARTICLES

Optional Information

Copyright
Copyright (c) 2008 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.