Addendum to ''Phase selection and transition in Hf-rich hafnia-titania nanolaminates'' (on SiO2) [J. Appl. Phys. 109, 123523 (2011)]: Hafnon formation
- 1. Department of Chemistry and Biochemistry, University of Wisconsin-Milwaukee, P.O. Box 413, Milwaukee, Wisconsin 53201 (United States)
Description
Continued investigation of hafnia-titania nanolaminates on silica substrates after long term annealing shows that hafnon (HfSiO4) is formed, in addition to the previously reported phases. Here, a 293 nm-thick stack of 5 nm HfO2-4 nm TiO2 bilayers (0.51 mole fraction HfO2) is sputter deposited on fused SiO2 and annealed in air at 1173 K for up to 192 h and then at 1273 K for up to 96 h. X-ray diffraction shows that hafnon crystallizes after 24 h at 1273 K. Micro-Raman spectroscopy/microscopy shows that hafnon crystallization is heterogeneous. No film-substrate reaction is observed for single layer HfO2 on SiO2 annealed under similar conditions. We suggest the nanolaminate's complex annealed microstructure provides fast diffusion paths that enable hafnon formation.
Additional details
Identifiers
- DOI
- 10.1063/1.4719968;
Publishing Information
- Journal Title
- Journal of Applied Physics
- Journal Volume
- 111
- Journal Issue
- 10
- Journal Page Range
- p. 109904-109904.3
- ISSN
- 0021-8979
- CODEN
- JAPIAU
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 43129353
- Subject category
- S36: MATERIALS SCIENCE; S77: NANOSCIENCE AND NANOTECHNOLOGY;
- Descriptors DEI
- ANNEALING; COMPOSITE MATERIALS; CRYSTALLIZATION; DEPOSITION; DIFFUSION; HAFNIUM OXIDES; HAFNIUM SILICATES; LAYERS; MICROSTRUCTURE; NANOSTRUCTURES; OPTICAL MICROSCOPY; RAMAN SPECTRA; RAMAN SPECTROSCOPY; SILICON OXIDES; SPUTTERING; SUBSTRATES; THIN FILMS; TITANIUM OXIDES; X-RAY DIFFRACTION
- Descriptors DEC
- CHALCOGENIDES; COHERENT SCATTERING; DIFFRACTION; FILMS; HAFNIUM COMPOUNDS; HEAT TREATMENTS; LASER SPECTROSCOPY; MATERIALS; MICROSCOPY; OXIDES; OXYGEN COMPOUNDS; PHASE TRANSFORMATIONS; REFRACTORY METAL COMPOUNDS; SCATTERING; SILICATES; SILICON COMPOUNDS; SPECTRA; SPECTROSCOPY; TITANIUM COMPOUNDS; TRANSITION ELEMENT COMPOUNDS
Optional Information
- Notes
- (c) 2012 American Institute of Physics