Published August 1994 | Version v1
Journal article

A method for determining critical currents from current-voltage curves of silver-sheathed bismuth tapes

  • 1. Power Networks Lab., Swiss Federal Inst. of Technol., Lausanne (Switzerland)

Description

We are at present measuring current-voltage characteristics of Ag-sheathed Bi(2223) tape samples, in DC, AC and transient phenomena conditions. One of our aims is the precise determination of our samples' critical currents. In this paper, we present a critical-current determination method, based on the search for an optimal fit of our curves, approximated by an exponential law, in DC and AC current conditions. This method made it possible to avoid the arbitrary choice of a voltage threshold that did not allow a significant comparison between the AC and DC curves. Furthermore, we were able to determine the parameters of the exponential law, which appears to agree well with our experimental results. (author)

Availability note (English)

Available online at the Web site for the journal Superconductor Science and Technology (ISSN 1361-6668) http://www.iop.org/

Additional details

Identifiers

Publishing Information

Journal Title
Superconductor Science and Technology
Journal Volume
7
Journal Issue
8
Journal Page Range
p. 592-595
ISSN
0953-2048