Published 2006 | Version v1
Miscellaneous

Quality assurance of silicon strip detectors and monitoring of manufacturing process

  • 1. Institut fuer Hochenergiephysik, Austrian Academy of Sciences (Austria)

Description

Full text: The Compact Muon Solenoid (CMS) is one of the experiments at the Large Hadron Collider (LHC) currently under construction at CERN. Its inner tracking system consists of the world's largest Silicon Strip Tracker (SST) which implements around 25000 silicon sensors covering an area of 206 m2. The CMS collaboration developed a detailed quality assurance scheme in order to ensure the functionality of all these sensors for the full LHC lifetime. After explaining the basic elements of the quality assurance program the measurements performed on the sensors and on dedicated test structures will be presented. During the production several severe problems were identified and eventually solved in cooperation with the manufacturing companies. Results from these measurements will be shown. (author)

Part of:
56. annual symposium of the Austrian Physical Society. Abstracts

Additional details

Additional titles

Original title (English)
56. Jahrestagung der Oesterreichischen Physikalischen Gesellschaft. Kurzfassungen

Publishing Information

Publisher
Austrian Physical Society
Imprint Place
Graz (Austria)
Imprint Title
56. annual symposium of the Austrian Physical Society. Abstracts
Imprint Pagination
175 p.
Journal Page Range
p. 60
Report number
INIS-AT--0081

Conference

Title
56. annual symposium of the Austrian Physical Society
Original Conference Title
56. Jahrestagung der Oesterreichischen Physikalischen Gesellschaft
Dates
18-21 Sep 2006
Place
Graz (Austria)

INIS

Country of Publication
Austria
Country of Input or Organization
Austria
INIS RN
38096701
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
Conference, Non-conventional Literature
Descriptors DEI
CERN LHC; MANUFACTURING; NONDESTRUCTIVE TESTING; QUALITY ASSURANCE; QUALITY CONTROL; SI SEMICONDUCTOR DETECTORS
Descriptors DEC
ACCELERATORS; CONTROL; CYCLIC ACCELERATORS; MATERIALS TESTING; MEASURING INSTRUMENTS; RADIATION DETECTORS; SEMICONDUCTOR DETECTORS; STORAGE RINGS; SYNCHROTRONS; TESTING

Optional Information

Notes
Imprint:56. Jahrestagung der Oesterreichischen Physikalischen Gesellschaft. Kurzfassungen