Catalyst free self-assembled growth of InN nanorings on stepped Si (5 5 3) surface
Description
Highlights: • Novel technique to synthesis self-assembled InN nanorings by low energy N. • Anisotropic strain relaxation driven self-assembly lead to formation of nanorings. • Strong downward band bending in VB-spectra signify large electron accumulation. - Abstract: A novel technique for synthesis of high crystalline quality self-assembled InN nanorings, by nitriding the bulk deposited In/Si (5 5 3)-1 × 4 system using low energy N2+ ions at 520 °C, has been demonstrated. Scanning electron microscopy images reveal the formation of ring shaped InN structures with average size ∼500 nm. Anisotropic strain relaxation via self assembly could be the driving force for the formation of these InN rings on reconstructed Si (5 5 3) surface. High resolution X-ray diffraction analysis indicates high crystalline quality of these wurtzite InN nanostructures with c-plane. A strong downward band bending was observed in X-ray photoelectron spectroscopy valence band spectra which signify the large electron accumulation in the InN nanostructures
Availability note (English)
Available from http://dx.doi.org/10.1016/j.apsusc.2015.03.167Additional details
Identifiers
- DOI
- 10.1016/j.apsusc.2015.03.167;
- PII
- S0169-4332(15)00783-7;
Publishing Information
- Journal Title
- Applied Surface Science
- Journal Volume
- 345
- Journal Page Range
- p. 156-161
- ISSN
- 0169-4332
- CODEN
- ASUSEE
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 47037854
- Subject category
- S77: NANOSCIENCE AND NANOTECHNOLOGY;
- Descriptors DEI
- ANISOTROPY; CATALYSTS; INDIUM NITRIDES; IONS; NANOSTRUCTURES; RELAXATION; RESOLUTION; RINGS; SCANNING ELECTRON MICROSCOPY; SPECTRA; STRAINS; SURFACES; SYNTHESIS; X-RAY DIFFRACTION; X-RAY PHOTOELECTRON SPECTROSCOPY
- Descriptors DEC
- CHARGED PARTICLES; COHERENT SCATTERING; DIFFRACTION; ELECTRON MICROSCOPY; ELECTRON SPECTROSCOPY; INDIUM COMPOUNDS; MICROSCOPY; NITRIDES; NITROGEN COMPOUNDS; PHOTOELECTRON SPECTROSCOPY; PNICTIDES; SCATTERING; SPECTROSCOPY
Optional Information
- Copyright
- Copyright (c) 2015 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.