Zinc deposition with pack cementation on low carbon steel substrates
Creators
- 1. Department of Physics, Aristotle University of Thessaloniki, GR 54124 Thessaloniki (Greece)
- 2. Department of Mechanical Engineering, Aristotle University of Thessaloniki, GR 54124 Thessaloniki (Greece)
Description
The structure of Zn coatings formed with pack cementation at 250, 350, 380, 400 and 450 deg. C have been studied with Scanning Electron Microscopy, X-ray diffraction and microhardness measurments. From this investigation it turned up that these coatings are composed of two layers referring to Γ-Fe11Zn40 and δ-FeZn10 phases of the Fe-Zn phase diagram, while inclusions were also detected, composed of Fe and Zn at almost equal concentrations. Furthermore it was deduced that the coating thickness at 400 and 450 deg. C is a function of t 1/2, where t is the heating time. However, the microstructure is similar in every case. Finally, it was concluded that the microhardness of the pack coatings is higher than the microhardness of the hot-dip galvanized coatings
Additional details
Identifiers
- DOI
- 10.1016/j.jallcom.2005.08.037;
- PII
- S0925-8388(05)01376-9;
Publishing Information
- Journal Title
- Journal of Alloys and Compounds
- Journal Volume
- 416
- Journal Issue
- 1-2
- Journal Page Range
- p. 125-130
- ISSN
- 0925-8388
- CODEN
- JALCEU
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 38040479
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- CARBON STEELS; COATINGS; HOT DIPPING; LAYERS; MICROHARDNESS; MICROSTRUCTURE; PHASE DIAGRAMS; SCANNING ELECTRON MICROSCOPY; X-RAY DIFFRACTION; ZINC
- Descriptors DEC
- ALLOYS; CARBON ADDITIONS; COHERENT SCATTERING; DEPOSITION; DIAGRAMS; DIFFRACTION; DIP COATING; ELECTRON MICROSCOPY; ELEMENTS; HARDNESS; INFORMATION; IRON ALLOYS; IRON BASE ALLOYS; MECHANICAL PROPERTIES; METALS; MICROSCOPY; SCATTERING; STEELS; SURFACE COATING; TRANSITION ELEMENT ALLOYS
Optional Information
- Copyright
- Copyright (c) 2005 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.