Published January 2011
| Version v1
Journal article
Beyond Snel's law: Refraction of a nano-beam of light
- 1. Science Systems and Applications, Inc., Hampton, VA 23666 (United States)
- 2. Army Research Laboratory, 2800 Powder Mill Road, Adelphi, MD 20783 (United States)
- 3. NASA Langley Research Center, Hampton, VA 23681 (United States)
- 4. Department of Atmospheric Sciences, University of Washington, WA 98195 (United States)
Description
The refraction of a localized narrow beam is significantly different from that of a plane wave. As the beam width decreases to be in the order of the wavelength, the refraction behavior deviates noticeably from Snel's law, and when the width of a light beam is smaller than about one fifth of the wavelength of the incident light, finite-difference time-domain simulations demonstrate that refraction becomes negligible. That is, the narrow light beam retains its propagation direction even after entering another medium at an oblique angle. The result reveals novel features of nano-beams and may have applications in precise biomedical measurement or micro optical device.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.jqsrt.2010.03.009Additional details
Identifiers
- DOI
- 10.1016/j.jqsrt.2010.03.009;
- PII
- S0022-4073(10)00119-6;
Publishing Information
- Journal Title
- Journal of Quantitative Spectroscopy and Radiative Transfer
- Journal Volume
- 112
- Journal Issue
- 2
- Journal Page Range
- p. 174-176
- ISSN
- 0022-4073
- CODEN
- JQSRAE
Conference
- Title
- 1. international symposium on atmospheric light scattering and remote sensing
- Acronym
- ISALSaRS'09
- Dates
- 13-17 Jul 2009
- Place
- Xian (China)
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 44008382
- Subject category
- S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- BEAM PROFILES; BEAMS; REFRACTION; SIMULATION; WAVE PROPAGATION; WAVELENGTHS
Optional Information
- Copyright
- Copyright (c) 2010 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.