Published January 2011 | Version v1
Journal article

Beyond Snel's law: Refraction of a nano-beam of light

  • 1. Science Systems and Applications, Inc., Hampton, VA 23666 (United States)
  • 2. Army Research Laboratory, 2800 Powder Mill Road, Adelphi, MD 20783 (United States)
  • 3. NASA Langley Research Center, Hampton, VA 23681 (United States)
  • 4. Department of Atmospheric Sciences, University of Washington, WA 98195 (United States)

Description

The refraction of a localized narrow beam is significantly different from that of a plane wave. As the beam width decreases to be in the order of the wavelength, the refraction behavior deviates noticeably from Snel's law, and when the width of a light beam is smaller than about one fifth of the wavelength of the incident light, finite-difference time-domain simulations demonstrate that refraction becomes negligible. That is, the narrow light beam retains its propagation direction even after entering another medium at an oblique angle. The result reveals novel features of nano-beams and may have applications in precise biomedical measurement or micro optical device.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.jqsrt.2010.03.009

Additional details

Identifiers

DOI
10.1016/j.jqsrt.2010.03.009;
PII
S0022-4073(10)00119-6;

Publishing Information

Journal Title
Journal of Quantitative Spectroscopy and Radiative Transfer
Journal Volume
112
Journal Issue
2
Journal Page Range
p. 174-176
ISSN
0022-4073
CODEN
JQSRAE

Conference

Title
1. international symposium on atmospheric light scattering and remote sensing
Acronym
ISALSaRS'09
Dates
13-17 Jul 2009
Place
Xian (China)

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
44008382
Subject category
S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS;
Resource subtype / Literary indicator
Conference
Descriptors DEI
BEAM PROFILES; BEAMS; REFRACTION; SIMULATION; WAVE PROPAGATION; WAVELENGTHS

Optional Information

Copyright
Copyright (c) 2010 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.