Si-PM based beam phase measurement technique for cyclotron

For cyclotrons, beam phase measurement system is an essential tool for precise magnetic field tuning. Various non-intercepting capacitive and inductive phase measurement systems are used worldwide, which measures currents associated with the image charges produced by the accelerated beam. However, these methods needs intense beam bunches to produce the required phase information. In our present technique, we have used an interceptive probe comprising of plastic scintillator followed by optically coupled Si-PM diode. This technique provides the capability of phase detection even in very low beam current (in range of few nA). The technique was successfully tested in K=130 cyclotron at VECC