Stochastic motion of 7 x 7 kinks at monoatomic step edges on the Si(1 1 1) surface
Creators
Description
An offset of a straight step, called a kink, is occasionally formed on semiconductor surfaces. The motion of the kink on the Si(1 1 1) 7x7 surface in the [1-bar 1-bar 2] step was studied in detail by high-temperature scanning tunneling microscopy (STM), and thermal fluctuations of the kink displacement along the step edges was observed. The kink displacement did not diverge with time, suggesting that a restoring force acts on the kink. The displacement, however, could be clearly represented by the gaussian distribution and it was therefore considered to be a Brownian particle. The temperature dependence of the mean square displacement of the kink position showed that the displacement is a thermal activation process with an apparent activation energy of 1.54±0.1 eV. From the equation of motion on the kink displacement including an incoming and outgoing flux as a fluctuation source, the phenomenological Langevin equation was derived. The activation energy of the kink displacement is related to the diffusion coefficient of the two-dimensional adatom gas and the latent heat of the atoms from the kink site to the surface adatom
Additional details
Identifiers
- DOI
- 10.1016/S0169-4332(03)00489-6;
- arXiv
- arXiv:hep-th/9702049v2;
- PII
- S0169433203004896;
Publishing Information
- Journal Title
- Applied Surface Science
- Journal Volume
- 216
- Journal Issue
- 1-4
- Journal Page Range
- p. 30-34
- ISSN
- 0169-4332
- CODEN
- ASUSEE
Conference
- Title
- 4. international symposium on the control of semiconductor interfaces
- Dates
- 21-25 Oct 2002
- Place
- Karuizawa (Japan)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 38086726
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ACTIVATION ENERGY; DIFFUSION; EQUATIONS OF MOTION; EV RANGE 01-10; FLUCTUATIONS; GAUSS FUNCTION; HEAT; KINK INSTABILITY; LANGEVIN EQUATION; SCANNING TUNNELING MICROSCOPY; SEMICONDUCTOR MATERIALS; SILICON; SURFACES; TEMPERATURE DEPENDENCE
- Descriptors DEC
- DIFFERENTIAL EQUATIONS; ELEMENTS; ENERGY; ENERGY RANGE; EQUATIONS; EV RANGE; FUNCTIONS; INSTABILITY; MATERIALS; MICROSCOPY; PARTIAL DIFFERENTIAL EQUATIONS; PLASMA INSTABILITY; PLASMA MACROINSTABILITIES; SEMIMETALS; VARIATIONS
Optional Information
- Copyright
- Copyright (c) 2003 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.