Published June 30, 2003 | Version v1
Journal article

Stochastic motion of 7 x 7 kinks at monoatomic step edges on the Si(1 1 1) surface

Description

An offset of a straight step, called a kink, is occasionally formed on semiconductor surfaces. The motion of the kink on the Si(1 1 1) 7x7 surface in the [1-bar 1-bar 2] step was studied in detail by high-temperature scanning tunneling microscopy (STM), and thermal fluctuations of the kink displacement along the step edges was observed. The kink displacement did not diverge with time, suggesting that a restoring force acts on the kink. The displacement, however, could be clearly represented by the gaussian distribution and it was therefore considered to be a Brownian particle. The temperature dependence of the mean square displacement of the kink position showed that the displacement is a thermal activation process with an apparent activation energy of 1.54±0.1 eV. From the equation of motion on the kink displacement including an incoming and outgoing flux as a fluctuation source, the phenomenological Langevin equation was derived. The activation energy of the kink displacement is related to the diffusion coefficient of the two-dimensional adatom gas and the latent heat of the atoms from the kink site to the surface adatom

Additional details

Identifiers

DOI
10.1016/S0169-4332(03)00489-6;
arXiv
arXiv:hep-th/9702049v2;
PII
S0169433203004896;

Publishing Information

Journal Title
Applied Surface Science
Journal Volume
216
Journal Issue
1-4
Journal Page Range
p. 30-34
ISSN
0169-4332
CODEN
ASUSEE

Conference

Title
4. international symposium on the control of semiconductor interfaces
Dates
21-25 Oct 2002
Place
Karuizawa (Japan)

Optional Information

Copyright
Copyright (c) 2003 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.