Published 1991
| Version v1
Book
Electronic considerations for externally segmented germanium detectors
Description
The dominant background source for germanium gamma ray detector spectrometers used for some astrophysics observations is internal beta decay. Externally segmented germanium gamma ray coaxial detectors can identify beta decay by localizing the event. Energetic gamma rays interact in the germanium detector by multiple Compton interactions while beta decay is a local process. In order to recognize the difference between gamma rays and beta decay events, the external electrode (outside of detector) is electrically partitioned. The instrumentation of these external segments and the consequence with respect to the spectrometer energy signal is examined. 3 refs
Additional details
Publishing Information
- Publisher
- American Institute of Physics.
- Imprint Place
- New York, NY (United States)
- Imprint Title
- Gamma-ray line astrophysics; Proceedings of the International Symposium, Paris, France, Dec. 10-13, 1990
- Imprint Pagination
- 541 p.
- Journal Page Range
- p. 509-511.
Conference
- Title
- Gamma-ray line astrophysics symposium.
- Dates
- 10-13 Dec 1990.
- Place
- Paris (France).
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 24016120
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- BACKGROUND RADIATION; BETA DECAY; BETA PARTICLES; COMPTON EFFECT; DESIGN; ELECTRODES; FIELD EFFECT TRANSISTORS; GAMMA DETECTION; GAMMA SPECTROMETERS; GE SEMICONDUCTOR DETECTORS; GERMANIUM; PREAMPLIFIERS
- Descriptors DEC
- AMPLIFIERS; BASIC INTERACTIONS; CHARGED PARTICLES; DECAY; DETECTION; ELASTIC SCATTERING; ELECTROMAGNETIC INTERACTIONS; ELECTRONIC EQUIPMENT; ELEMENTS; EQUIPMENT; INTERACTIONS; IONIZING RADIATIONS; MEASURING INSTRUMENTS; METALS; NUCLEAR DECAY; RADIATION DETECTION; RADIATION DETECTORS; RADIATIONS; SCATTERING; SEMICONDUCTOR DETECTORS; SEMICONDUCTOR DEVICES; SPECTROMETERS; TRANSISTORS
Optional Information
- Notes
- Imprint:AIP Conference Proceedings, No. 232.
- Secondary number(s)
- CONF-901275--.