Published April 1989
| Version v1
Journal article
Comprehensive characterization of CdTe and (Cd, Zn)Te single crystals by a chemical etchant
Creators
- 1. Humboldt-Universitaet, Berlin (German Democratic Republic). Sektion Physik
Description
Using a known chemical etchant low- and high angle boundaries and lamellar twins can be seen on CdTe and (Cd, Zn)Te crystal ingots as a whole as well as on slices with naked eyes. Also the polarity of (111) samples can be determined in this way. Etch pits are produced on cut and polished surfaces independent of their crystallographic orientation. A new modified etchant was used to study the low angle subgrain structure on (111)Te surfaces. (author)
Additional details
Publishing Information
- Journal Title
- Crystal Research and Technology
- Journal Volume
- 24
- Journal Issue
- 4
- Series
- Cryst. Res. Technol.
- Journal Page Range
- 365-369
- ISSN
- 0232-1300
- CODEN
- CRTED
INIS
- Country of Publication
- Germany
- Country of Input or Organization
- German Democratic Republic
- INIS RN
- 20083282
- Subject category
- S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
- Descriptors DEI
- CADMIUM TELLURIDES; ETCHING; GRAIN BOUNDARIES; IMAGES; MONOCRYSTALS; SURFACES; TWINNING; ZINC TELLURIDES
- Descriptors DEC
- CADMIUM COMPOUNDS; CHALCOGENIDES; CRYSTAL STRUCTURE; CRYSTALS; MICROSTRUCTURE; TELLURIDES; TELLURIUM COMPOUNDS; ZINC COMPOUNDS