Published November 1996 | Version v1
Journal article

X-Ray Based Subpicosecond Electron Bunch Characterization Using 90 degree Thomson Scattering

  • 1. Physics Department, University of California at Berkeley, Berkeley, California 94720 (United States)
  • 2. Ernest Orlando Lawrence Berkeley National Laboratory, University of California at Berkeley, Berkeley, California 94720 (United States)

Description

X rays produced by 90 degree Thomson scattering of a femtosecond, near infrared, terawatt laser pulse of a 50 MeV electron beam are shown to be an effective diagnostic to measure transverse and longitudinal density distributions of an electron beam (e beam) with subpicosecond time resolution. The laser beam was focused onto the e-beam waist, generating 30 keV x rays in the forward direction. The transverse and longitudinal e-beam structures have been obtained by measuring the intensity of the x-ray beam, while scanning the laser beam across the e beam in space and time. The e-beam divergence has been obtained through measurement of spatial and spectral characteristics of the scattered x-ray beam. copyright 1996 The American Physical Society

Additional details

Publishing Information

Journal Title
Physical Review Letters
Journal Volume
77
Journal Issue
20
Journal Page Range
p. 4182-4185.
ISSN
0031-9007
CODEN
PRLTAO