Published October 1, 2011 | Version v1
Journal article

Development of a plasma panel muon detector

  • 1. University of Michigan, Department of Physics, Ann Arbor, MI (United States)
  • 2. Oak Ridge National Laboratory, Oak Ridge, TN (United States)
  • 3. Tel Aviv University, Beverly and Raymond Sackler School of Physics and Astronomy, Tel Aviv (Israel)
  • 4. Integrated Sensors, LLC, Toledo, OH (United States)
  • 5. Brookhaven National Laboratory, Upton, NY (United States)

Description

A radiation detector technology based on plasma display panels (PDPs), the underlying engine of panel plasma television displays, is being investigated. Emerging from this well-established television technology is the Plasma Panel Sensor (PPS), a novel variant of the micro-pattern radiation detector. The PPS is fundamentally a fast, high-resolution detector comprised of an array of plasma discharge cells, operating in a hermetically sealed gas mixture. We report on the PPS development effort, including proof-of-principle results of laboratory signal observations.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.nima.2010.07.076

Additional details

Identifiers

DOI
10.1016/j.nima.2010.07.076;
PII
S0168-9002(10)01690-6;

Publishing Information

Journal Title
Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
Journal Volume
652
Journal Issue
1
Journal Page Range
p. 315-318
ISSN
0168-9002
CODEN
NIMAER

Conference

Title
12. Symposium on radiation measurements and applications (SORMA)
Dates
24-28 May 2010
Place
Ann Arbor, MI (United States)

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
44001833
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
DISPLAY DEVICES; MIXTURES; MUONS; PANELS; PLASMA; RADIATION DETECTORS; RESOLUTION; SENSORS
Descriptors DEC
COMPUTER OUTPUT DEVICES; COMPUTER-GRAPHICS DEVICES; DISPERSIONS; ELEMENTARY PARTICLES; FERMIONS; LEPTONS; MEASURING INSTRUMENTS

Optional Information

Copyright
Copyright (c) 2010 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.