A new experiment station on beamline 4B7A at Beijing Synchrotron Radiation Facility
Description
A new experiment station was installed on beamline 4B7A at Beijing Synchrotron Radiation Facility (BSRF), making it possible to record X-ray absorption fine structure (XAFS) spectrum in three modes over an energy range from 1750 eV to 6000 eV. A 13-element Si(Li) array detector and a single-element SDD detector were used to acquire data in partial fluorescence yield (PFY) mode. Two low-pressure noble gas ion chambers were adopted for measuring XAFS in transmission mode. In total electron yield (TEY) mode the current of sample is recorded. Solid, wet and liquid samples were suitable for this experimental station. Some representative results obtained from this station were shown and discussed. - Highlights: • A new experiment station was installed on beamline 4B7A at BSRF. • This experiment station has three modes for recording X-ray XAFS spectrum. • The energy region covers the K-edge of elements Si, P, S, Cl, K, Ca and Ti. • Solid, wet and liquid samples can be measured in this experiment station
Availability note (English)
Available from http://dx.doi.org/10.1016/j.sab.2014.07.006Additional details
Identifiers
- DOI
- 10.1016/j.sab.2014.07.006;
- PII
- S0584-8547(14)00146-3;
Publishing Information
- Journal Title
- Spectrochimica Acta. Part B, Atomic Spectroscopy
- Journal Volume
- 101
- Journal Page Range
- p. 1-5
- ISSN
- 0584-8547
- CODEN
- SAASBH
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 47009081
- Subject category
- S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
- Descriptors DEI
- ABSORPTION SPECTROSCOPY; CALCIUM; CHLORINE; FINE STRUCTURE; FLUORESCENCE; IONIZATION CHAMBERS; MULTI-ELEMENT ANALYSIS; POTASSIUM; QUANTITATIVE CHEMICAL ANALYSIS; RARE GASES; SI SEMICONDUCTOR DETECTORS; SILICON; SULFUR; SYNCHROTRON RADIATION; TITANIUM; X-RAY SPECTROSCOPY
- Descriptors DEC
- ALKALI METALS; ALKALINE EARTH METALS; BREMSSTRAHLUNG; CHEMICAL ANALYSIS; ELECTROMAGNETIC RADIATION; ELEMENTS; EMISSION; FLUIDS; GASES; HALOGENS; LUMINESCENCE; MEASURING INSTRUMENTS; METALS; NONMETALS; PHOTON EMISSION; RADIATION DETECTORS; RADIATIONS; SEMICONDUCTOR DETECTORS; SEMIMETALS; SPECTROSCOPY; TRANSITION ELEMENTS
Optional Information
- Copyright
- Copyright (c) 2014 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.