Published September 18, 2019 | Version v1
Miscellaneous

Secondary ion mass spectrometry: comparison of meteorite and vulcanite

  • 1. Katedra fyzikalnej a teoretickej chemie, Prirodovedecka fakulta, Univerzita Komenskeho, 84215 Bratislava (Slovakia)
  • 2. Katedra fyzikalnej a teoretickej chemie, Prirodovedecka fakulta, Univerzita Komenskeho, 84215 Bratislava and Medzinarodne laserove centrum, 84104 Bratislava (Slovakia)

Description

The aim of the work was chemical and isotopic characterization of a meteorite sample in comparison with volcanic rock using secondary ion mass spectrometry (SIMS). The objects examined were extraterrestrial samples; inside the Kosice meteorite, its fusion layer and volcanic rock from Mauna Loa volcano. In the measured spectra in both positive and negative polarity, chemical composition of individual samples was identified and consequently intensity tables for selected fragments and isotopes of elements were constructed. Isotope differences for 28Si, 29Si, and 30Si were found between volcanic stone of terrestrial origin and Kosice meteorite. Based on the acquired knowledge it is possible to confirm that secondary ion mass spectrometry is a suitable method for the analysis of meteorite samples. (authors)

Part of:
71. Congress of Chemists. Proceeding of Abstracts

Additional details

Additional titles

Original title (Slovak)
Hmotnostna spektrometria sekundarnych ionov: porovnanie meteoritu a vulkanitu

Publishing Information

Publisher
Slovak Chemical Society
Imprint Place
Bratislava (Slovakia)
Imprint Title
71. Congress of Chemists. Proceeding of Abstracts
Imprint Pagination
[197 p.]
Journal Volume
15
Journal Issue
1
Series
ChemZi. Slovensky casopis o chemii pre chemicke vzdelavanie, vyskum a priemysel
Journal Page Range
p. 149-150
ISSN
1336-7242
Report number
INIS-SK--2020-001

Conference

Title
71. Congress of Chemists
Original Conference Title
71. Zjazd chemikov. Zbornik abstraktov
Dates
9-13 Sep 2019
Place
Vysoke Tatry, Horny Smokovec (Slovakia)

Optional Information

Notes
3 refs., 1 fig.