Published February 2012
| Version v1
Journal article
Laser measurement of H- ions in a field-effect-transistor based radio frequency ion source
Creators
- 1. Tohoku University, Aramaki 6-6-05, Aoba, Sendai, Miyagi 980-8579 (Japan)
- 2. Yamaguchi University, Tokiwadai 2-16-1, Ube, Yamaguchi 755-8611 (Japan)
- 3. National Institute for Fusion Science, Oroshi-Cho 322-6, Toki, Gifu 509-5292 (Japan)
Description
Hydrogen negative ion density measurements are required to clarify the characteristics of negative ion production and ion source performance. Both of laser photodetachment and cavity ring down (CRD) measurements have been implemented to a field-effect-transistor based radio-frequency ion source. The density ratio of negative hydrogen ions to electrons was successfully measured by laser photodetachment and effect of magnetic filter field on negative ion density was confirmed. The calculated CRD signal showed that CRD mirrors with >99.990% reflectivity are required and loss of reflectivity due to cesium contamination should be minimized.
Additional details
Identifiers
- DOI
- 10.1063/1.3680549;
Publishing Information
- Journal Title
- Review of Scientific Instruments
- Journal Volume
- 83
- Journal Issue
- 2
- Journal Page Range
- p. 02A731-02A731.3
- ISSN
- 0034-6748
- CODEN
- RSINAK
Conference
- Title
- 14. international conference on ion sources
- Acronym
- ICIS 2011
- Dates
- 12-16 Sep 2011
- Place
- Giardini-Naxos, Sicily (Italy)
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 44023112
- Subject category
- S70: PLASMA PHYSICS AND FUSION TECHNOLOGY; S43: PARTICLE ACCELERATORS;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- CESIUM; ELECTRON DENSITY; ELECTRON DETACHMENT; ELECTRONS; FIELD EFFECT TRANSISTORS; HYDROGEN; HYDROGEN IONS 1 MINUS; ION DENSITY; ION SOURCES; LASER CAVITIES; LASERS; MAGNETIC FILTERS; RADIOWAVE RADIATION; REFLECTIVITY
- Descriptors DEC
- ALKALI METALS; ANIONS; CHARGED PARTICLES; ELECTROMAGNETIC RADIATION; ELEMENTARY PARTICLES; ELEMENTS; FERMIONS; FILTERS; HYDROGEN IONS; IONS; LEPTONS; METALS; NONMETALS; OPTICAL PROPERTIES; PHYSICAL PROPERTIES; RADIATIONS; SEMICONDUCTOR DEVICES; SURFACE PROPERTIES; TRANSISTORS
Optional Information
- Notes
- (c) 2012 American Institute of Physics