Published March 1991
| Version v1
Journal article
Fabrication and characterization of hybrid Nb-YBCO dc SQUIDs
Creators
- 1. Hypres, Inc., Elmsford, NY (United States)
Description
This paper reports on the fabrication of hybrid low Tc/high Tc dc SQUIDs of two flavors. The first kind utilizes niobium tunnel junctions and a YBCO film strip as the most inductive portion of the SQUID loop. This configuration allows a direct measurement of the inductance of the YBCO microstrip from which the effective penetration depth can be calculated. The successful fabrication of these SQUIDs has required 1. superconducting Nb-to-YBCO contacts, 2. deposition and patterning of an SiO2 insulation layer over YBCO, and 3. selective patterning of niobium and SiO2 relative to YBCO. All these process steps are pertinent to the eventual use of YBCO thin films in electronic devices
Additional details
Publishing Information
- Journal Title
- IEEE Transactions on Magnetics
- Journal Volume
- 27
- Journal Issue
- 2
- Series
- IEEE Trans. Magn.
- Journal Page Range
- 2561-2564
- ISSN
- 0018-9464
- CODEN
- IEMGA
Conference
- Title
- 1990 applied superconductivity conference.
- Dates
- 24-28 Sep 1990.
- Place
- Snowmass, CO (United States).
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 23020913
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; S36: MATERIALS SCIENCE; S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- BARIUM OXIDES; CALCULATION METHODS; COPPER OXIDES; FABRICATION; GRAIN BOUNDARIES; HYBRID RESONANCE; JUNCTION TRANSISTORS; MAGNETIC INSULATION; NIOBIUM; PENETRATION DEPTH; SILICON OXIDES; SQUID DEVICES; SUPERCONDUCTING FILMS; SUPERCONDUCTING JUNCTIONS; SUPERCONDUCTIVITY; TUNNEL EFFECT; YTTRIUM OXIDES
- Descriptors DEC
- ALKALINE EARTH METAL COMPOUNDS; BARIUM COMPOUNDS; CHALCOGENIDES; COPPER COMPOUNDS; CRYSTAL STRUCTURE; ELECTRIC CONDUCTIVITY; ELECTRICAL PROPERTIES; ELECTRONIC EQUIPMENT; ELEMENTS; EQUIPMENT; FILMS; FLUXMETERS; MEASURING INSTRUMENTS; METALS; MICROSTRUCTURE; MICROWAVE EQUIPMENT; OXIDES; OXYGEN COMPOUNDS; PHYSICAL PROPERTIES; RESONANCE; SEMICONDUCTOR DEVICES; SILICON COMPOUNDS; SUPERCONDUCTING DEVICES; TRANSISTORS; TRANSITION ELEMENT COMPOUNDS; TRANSITION ELEMENTS; YTTRIUM COMPOUNDS
Optional Information
- Secondary number(s)
- CONF-900944--.