An experimental study of argon plasma in aluminium coated plasma chamber of 6.4 GHz ECR ion source at VECC
Creators
- 1. Variable Energy Cyclotron Centre, Bidhannagar, Kolkata (India)
Description
A multiply charged two stage 6.4 GHz Electron Cyclotron Resonance (ECR) ion source was developed in VECC a few years ago. It was modified in phases based on magnetic topology, microwave feed and external supply of cold electrons to improve the ion production performance. In the present experimental study electron repeller biased disc as Langmuir probe was used to understand the electron repeller effect in aluminum coated plasma chamber of 6.4 GHz ECR ion source. Here, the repeller aluminium disc placed on the axis of the plasma chamber has been biased with respect to the floating plasma chamber. Probe current and ion current of Ar+ were measured at different bias voltages and currents for a particular discharge condition. The discharge condition was varied by changing only microwave power heating the plasma but the mirror magnetic field and gas feed remained unchanged throughout the experiment
Additional details
Publishing Information
- Publisher
- Allied Publishers Pvt. Ltd.
- Imprint Place
- New Delhi (India)
- ISBN
- 81-7764-407-6
- Imprint Title
- Proceedings of the DAE-BRNS Indian particle accelerator conference-2003
- Imprint Pagination
- 773 p.
- Journal Page Range
- p. 175-176
Conference
- Title
- 1. DAE-BRNS Indian particle accelerator conference
- Acronym
- InPAC-2003
- Dates
- 3-6 Feb 2003
- Place
- Indore (India)
INIS
- Country of Publication
- India
- Country of Input or Organization
- India
- INIS RN
- 35008139
- Subject category
- S43: PARTICLE ACCELERATORS;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ARGON IONS; CHARGE DISTRIBUTION; ECR ION SOURCES; ELECTRON CYCLOTRON-RESONANCE; ELECTRON EMISSION; GHZ RANGE 01-100; MAGNETIC FIELDS; MICROWAVE HEATING; PERFORMANCE TESTING
- Descriptors DEC
- CHARGED PARTICLES; CYCLOTRON RESONANCE; EMISSION; FREQUENCY RANGE; GHZ RANGE; HEATING; ION SOURCES; IONS; RESONANCE; TESTING
Optional Information
- Notes
- 7 refs., 4 figs., 1 tab.