Published 2004
| Version v1
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Structural and morphological studies of ZnO: F films
Creators
- 1. ESFM-IPN, A.P. 75-544, 07300 Mexico D.F. (Mexico)
- 2. CINVESTAV-IPN, A.P. 14-740, 07000 Mexico D.F. (Mexico)
Description
Semiconductor thin films Zn O and F doped, using the chemical spray technique has been pre- pared, starting from pentanedionate and zinc acetate and ammonium fluorine in ethanol and methanol for a solution at 0.25%. The concentration [F]/[Zn] and the substrate temperature have been changed. From the X-rays diffraction and scanning electron microscopy techniques, the electrical, optical and chemical stability properties for the layers were studied. Size, geometry, and the grain orientation, distribution and the roughness effect in the light trapping were discussed. (Author)
Availability note (English)
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35103684.pdf
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Additional details
Additional titles
- Original title (Spanish)
- Estudio estructural y morfologico de peliculas de ZnO: F
Publishing Information
- ISBN
- 970-773-023-4
- Imprint Pagination
- 6 p.
- Report number
- INIS-MX--1575
Conference
- Title
- 7. International Conference. 17 National Congress on Solid State Dosimetry
- Dates
- 8-10 Sep 2004
- Place
- Puebla (Mexico)
INIS
- Country of Publication
- Mexico
- Country of Input or Organization
- Mexico
- INIS RN
- 35103684
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ACETATES; AMMONIUM FLUORIDES; CONCENTRATION RATIO; COPPER; DIAGRAMS; ELECTRICAL PROPERTIES; ETHANOL; FLUORINE; GEOMETRY; GRAIN SIZE; IMAGES; METHANOL; MICROSCOPES; MILLER INDICES; MORPHOLOGY; OPTICAL PROPERTIES; RADIATION SOURCES; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTOR MATERIALS; SUBSTRATES; TEMPERATURE DEPENDENCE; THIN FILMS; X-RAY DIFFRACTION; X-RAY DIFFRACTOMETERS; ZINC OXIDES
- Descriptors DEC
- ALCOHOLS; AMMONIUM COMPOUNDS; AMMONIUM HALIDES; CARBOXYLIC ACID SALTS; CHALCOGENIDES; COHERENT SCATTERING; DIFFRACTION; DIFFRACTOMETERS; ELECTRON MICROSCOPY; ELEMENTS; FILMS; FLUORIDES; FLUORINE COMPOUNDS; HALIDES; HALOGEN COMPOUNDS; HALOGENS; HYDROXY COMPOUNDS; INFORMATION; MATERIALS; MATHEMATICS; MEASURING INSTRUMENTS; METALS; MICROSCOPY; MICROSTRUCTURE; NONMETALS; ORGANIC COMPOUNDS; OXIDES; OXYGEN COMPOUNDS; PHYSICAL PROPERTIES; SCATTERING; SIZE; TRANSITION ELEMENTS; ZINC COMPOUNDS