Evaluation of depth resolution with time-of-flight medium energy backscattering
- 1. Department of Chemical Engineering, Vanderbilt University, Nashville, TN 37235 (United States)
- 2. Department of Electrical Engineering and Computer Science, Vanderbilt University, Nashville, TN 37235 (United States)
- 3. Department of Chemical Engineering and Materials Science, University of Minnesota, Minneapolis, MN 55455 (United States)
Description
The energy and depth resolution of Vanderbilt's time-of-flight medium energy backscattering (TOF-MEBS) system has been evaluated as a function of target tilt and beam energy. The target tilt and beam energy for optimizing depth resolution of He+ scattering at a depth of 55 A was determined. Calculations were performed with DEPTH to determine how various energy spread factors contributed to depth resolution. The influence of detector position on depth resolution was also calculated. These results showed that depth resolution improved as the angle between the incident beam and detector decreased. However, the optimum target tilt angle did not change with detector position. Depth resolution measurements indicated an optimum target tilt angle of 6 deg. For more grazing angles, depth resolution degrades due to increased energy spread from multiple scattering, geometric spread and energy straggling. Due to the energy dependence of the TOF spectrometer, the beam energy for optimizing depth resolution is much lower than the stopping maximum of He+ ions in Al: ∼170 keV as opposed to ∼500 keV
Additional details
Identifiers
- DOI
- 10.1016/j.nimb.2005.08.184;
- PII
- S0168-583X(05)01682-4;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
- Journal Volume
- 243
- Journal Issue
- 2
- Journal Page Range
- p. 377-384
- ISSN
- 0168-583X
- CODEN
- NIMBEU
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 37069627
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- ABSORPTION; BACKSCATTERING; BEAMS; DEPTH; ENERGY DEPENDENCE; ENERGY RESOLUTION; HELIUM IONS; KEV RANGE 100-1000; MULTIPLE SCATTERING; SPECTROMETERS; THIN FILMS; TIME-OF-FLIGHT METHOD
- Descriptors DEC
- CHARGED PARTICLES; DIMENSIONS; ENERGY RANGE; FILMS; IONS; KEV RANGE; MEASURING INSTRUMENTS; RESOLUTION; SCATTERING; SORPTION
Optional Information
- Copyright
- Copyright (c) 2005 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.