Experimental study of the interaction of subpicosecond laser pulses with solid targets of varying initial scale lengths
Creators
- 1. Laboratoire pour lUtilisation des Lasers Intenses, UMR 100 du Centre National de la Recherche Scientifique, Ecole Polytechnique, 91128 Palaiseau (France)
- 2. Laboratoire dOptique Appliquee, URA 1406 du Centre National de la Recherche Scientifique, Batterie de lYvette, 91761 Palaiseau (France)
Description
We have studied experimentally the angular and energy distribution of the suprathermal electrons produced during the interaction of a 120 fs, 50 mJ, 800 nm, P-polarized laser pulse on SiO2 targets. A sharply collimated jet of electrons is observed in the laser specular reflection direction, in the plane of incidence, superimposed to an angularly uniform electron distribution. Electron energies are ∼20 keV for a laser intensity of 4x1016 Wcm-2 and 45 degree incidence angle. The electron jet is weaker and angularly broadened with the introduction of a laser prepulse controlling the electron density gradient scale length. Laser absorption and Kα line intensity measurements show a maximum for a prepulse delay of ∼6 ps with an electron energy rising to ∼180 keV. Gradient scale length measurements at this prepulse delay fit the laser absorption peak scaling obtained from standard resonant absorption theory. copyright 1997 The American Physical Society
Additional details
Publishing Information
- Journal Title
- Physical Review. E, Statistical Physics, Plasmas, Fluids, and Related Interdisciplinary Topics
- Journal Volume
- 56
- Journal Issue
- 6
- Journal Page Range
- p. 7179-7185
- ISSN
- 1063-651X
- CODEN
- PLEEE8
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 30051691
- Subject category
- S70: PLASMA PHYSICS AND FUSION TECHNOLOGY; S70: PLASMA PHYSICS AND FUSION TECHNOLOGY;
- Descriptors DEI
- ANGULAR DISTRIBUTION; ELECTRONS; ENERGY; LASER-PRODUCED PLASMA; PHOTOEMISSION; PLASMA DIAGNOSTICS; POLARIZATION; PULSES; REFLECTION; SILICON COMPOUNDS; SILICON OXIDES
- Descriptors DEC
- CHALCOGENIDES; DISTRIBUTION; ELEMENTARY PARTICLES; EMISSION; FERMIONS; LEPTONS; OXIDES; OXYGEN COMPOUNDS; PLASMA; SECONDARY EMISSION; SILICON COMPOUNDS